Veroeffentlichungen

Publikationen 2006

1) Almoro, P.; Pedrini, G.; Osten, W., "Phase retrieval by using a volume speckle field and synthetic aperture", Samahang Pisika pilipinas (SPP)- Proc. Of the National Physics Congress, October 2006, 2006

2) Almoro, P.; Pedrini, G.; Osten W., "Wave front phase and amplitude reconstruction techniques using multiple intensity patterns", Proc. SPIE, Vol. 6341, 63411C, Speckle06: Speckles, From Grains to Flowers; Pierre Slangen, Christine Cerruti; Eds., 2006

3) Almoro, P.; Pedrini, G.; Osten W., "Complete wavefront reconstruction using sequential intensity measurements of a volume speckle field", 45 (2006) 34 pp. 8596-605

4) Baumbach, T.; Kopylow, C.; Jüptner, W.; Osten, W., "Formvergleich zweier Objekte an unterschiedlichen Standorten mit digitaler Holografie", Technisches Messen 73 (2006) 3, pp. 120-131

5) Baumbach, T.; Osten, W.; von Kopylow, C.; Jüptner, W., "Remote metrology by comparative digital holography", Applied Optics 45 (2006) 5 pp. 925-34

6) Groves, R. M.; Osten, W., "Temporal phase measurement methods in shearography", Proc. SPIE, Vol. 6341, 63411L, Speckle06: Speckles, From Grains to Flowers; Pierre Slangen, Christine Cerruti; Eds., 2006

7) Groves, R. M.; Osten, W.; Pedrini, G.; Doulgeridis, M.; Kouloumpi, E.; Hackney, S.; Green, T.; Tornari, V., "Temporal Phase Measurement Methods in Speckle Interferometry for Art Conservation", Fringe Analysis Special Interest Group (FASIG), Photon06 Conference, Manchester, England, 2006

8) Haist, T., "Dynamic holography in biomedical applications", Proc. of 21. Biomedical photonics symposium, OITDA, Tokyo (JP), 1-2 Dec. 2006.

9) Haist, T.; Reicherter, M.; Wu, M.; Seifert, L., "Using graphics boards to compute holograms", Computing in Science & Engineering 8 (2006) 1 pp. 8-13

10) Hering, M.; Herrmann, S.; Körner, K.; Jähne, B., "Spatial Phase Shifting in White-Light Interferometry", Proc. of OPTO ’06, ISBN 3-9810993-0-3: 57-62, 2006

11) Hering, M.; Herrmann, S.; Banyay, M.; Körner, K.; Jähne, B., "One-shot line-profiling white-light interferometer with spatial phase shift for measuring rough surfaces", Proc. SPIE, Vol. 6188, 61880E, 2006

12) Kauffmann, J.; Kerwien, N.; Tiziani, H. J.; Osten, W., "Tomographic methods to characterize three-dimensional refractive index inhomogenities", ASPE 2005 Summer Topical Meeting, Middletown, 2006

13) Kauffmann, J.; Tiziani, H. J., "Time Resolved Vibration Measurement with Temporal Speckle Pattern Interferometry", Applied Optics 45 (2006) 26 pp. 6682-6688

14) Kohler, C.; Schwab, X.; Osten, W., "Optimally tuned spatial light modulators for digital holography", Applied Optics 45 (2006) 5 pp. 960-7

15) Kohler, C.; Schwab, X.; Osten, W.; Baumbach, T., "Charakterisierung von Flüssigkristalllichtmodulatoren für die Rekonstruktion digitaler Hologramme", Technisches Messen 73 (2006) 3 pp. 157-165

16) Kohler, C.; Droste, U.; Körner, K.; Osten, W., "Reduktion von Überschwingern bei der 3D-Streifenprojektion durch Inverse Filterung", Technisches Messen 73 (2006) 11 pp. 595-602

17) Körner, K.; Papastathopoulos, E.; Osten, W., "Some Aspects of Chromatic Confocal Spectral Interferometry", 18. IMEKO World Congress, Rio de Janeiro, Brazil, TC2 – Photonics, 2006

18) Körner, K.; Ruprecht, A. K.; Wiesendanger, T., "Optical profiling techniques for MEMS Measurement", in W. Osten (Editor) “Optical Inspection of Microsystems: Methods and Application”, CRC Taylor & Francis, Boca Raton London New York (2006) pp. 145-162

19) Osten, W., "Progress in total light control: components, methods, and applications", Proc. SPIE, Vol. 6341, 63410G, Speckle06: Speckles, From Grains to Flowers; Pierre Slangen, Christine Cerruti; Eds., 2006

20) Osten, W., "Holography in new shoes: A digital-analogue interface", Proc. 2006 IEEE LEOS Annual Meeting, Montreal 2006, pp. 72-73

21) Osten, W.; Ferraro, P., "Digital Holography for the Inspection of Microsystems", In: Osten, W. (Ed.): Optical Inspection of Microsystems. CRC Taylor & Francis, Boca Raton 2006, pp. 351-426

22) Osten, W.; Jüptner, W., "Messtechnik im Zeitalter der Globalisierung – Objektvergleich über große Entfernungen mit interferometrischer Empfindlichkeit", Technisches Messen 73 (2006) 3, 117-119

23) Papastathopoulos, E.; Körner, K.; Osten, W., "Chromatic confocal spectral interferometry with wavelet analysis", Proc. SPIE, Vol. 6189, 618913, 2006

24) Papastathopoulos, E.; Körner, K.; Osten, W., "Chromatic confocal spectral interferometry (CCSI)", Proc. SPIE, Vol. 6292, 629215, 2006

25) Papastathopoulos, E.; Körner, K.; Osten, W., "Stand und Potenzial der chromatisch- konfokalen Spektral-Interferometrie für die In-Line Fertigungsmesstechnik", Optische Industriesensorik, 2. Fachtagung Böblingen, 17. und 18.10.2006, 2006

26) Papastathopoulos, E.; Körner, K.; Osten, W., "Chromatic confocal spectral interferometry", Applied Optics 45 (2006) 32 pp. 8244-52

27) Papastathopoulos, E.; Körner, K.; Osten, W., "Chromatically dispersed interferometry with wavelet analysis", Optics Letters 31 (2006) 5 pp. 589-91

28) Pauliat, G.; Roosen, G.; Georges, M. P.; Pedrini, G., "Passive introduction of carrier fringes in real-time photorefractive interferometers for single interferogram analysis", Journal of the European Optical Society - Rapid publications, Vol. 1 (2006) 06424-1-6

29) Pedrini, G.; Gusev, M. E.; Osten, W., "High speed digital holographic interferometry", Proc. SPIE, Vol. 6345, 634506, Seventh International Conference on Vibration Measurements by Laser Techniques: Advances and Applications; Enrico P. Tomasini; Ed., 2006

30) Pedrini, G.; Alexeenko, I.; Osten W., "On-line surveillance of a dynamic process by a moving system based on pulsed digital holographic interferometry", Applied Optics 45 (2006) 5 pp. 935-43

31) Pedrini, G.; Osten, W.; Gusev, M., "High-speed digital holographic interferometry for vibration measurement", Applied Optics 45 (2006) 15 pp. 3456-62

32) Pruss, C.; Seifert, L.; Osten, W., "Zwischen Consumerkamera und Lithografieobjektiv", Optik & Photonik, Nov. 2006, pp. 32-36, ISSN 1863-1460, 2006

33) Regin, J.; Neher, J.; Westkämper, E.; Wiesendanger, T.; Osten, W., "Multiskalige Messstrategien für die Mikrosystemtechnik", Informationsfusion in der Mess- und Sensortechnik 2006 VDI/VDE-GMA, 21. und 22. Juni 2006, Eisenach, 2006

34) Reicherter, M.; Zwick, S.; Haist, T.; Kohler, C.; Tiziani, H.; Osten, W., "Fast digital hologram generation and adaptive force measurement in liquid-crystal-display-based holographic tweezers", Applied Optics 45 (2006) 5 pp. 888-96

35) Reichle, R.; Pruss, C.; Osten, W.; Tiziani, H. J.; Zimmermann, F.; Schulz, C., "Hybrid excitation and imaging optics for minimal invasive multiple-band UV-LIF-measurements in engines 5. Konferenz über Optische Analysenmesstechnik in Industrie und Umwelt OPTAM 2006", 26. bis 27. September 2006, Mannheim, Deutschland VDI-Berichte 1959, pp. 223-235, 2006

36) Reichle, R.; Pruss, C.; Osten, W.; Tiziani, H. J.; Zimmermann, F.; Schulz, C., "UV-Endoskop mit diffraktiver Aberrationskorrektur für die Motorenentwicklung", DGaO Proceedings 2006, 107. Tagung, “http://www.dgao-proceedings.de” ISSN: 1614-8436, 2006

37)Ruppel, T.; Haist, T.; Seifert, L.; Osten, W., "Wellenfrontmessung mit einem inhomogenen diffraktiven Mikrolinsenarray", DGaO Proceedings 2006, 107. Tagung, “http://www.dgao-proceedings.de” ISSN: 1614-8436, 2006

38) Saucedo Anaya, T.; Mendoza Santoyo, F.; Pedrini, G.; Osten, W., "3D endoscopic pulsed digital holography", Proc. SPIE, Vol. 6345, 634507, Seventh International Conference on Vibration Measurements by Laser Techniques: Advances and Applications; Enrico P. Tomasini; Ed., 2006

39) Saucedo, T. A.; Santoyo, F. M.; De la Torre Ibarra, M.; Pedrini, G.; Osten, W., "Simultaneous two-dimensional endoscopic pulsed digital holography for evaluation of dynamic displacements", Applied Optics 45 (2006) 19 pp. 4534-9

40) Saucedo, T. A.; Santoyo, F. M.; De la Torre Ibarra, M.; Pedrini, G.; Osten, W., "Endoscopic pulsed digital holography for 3D measurements", Opt. Express 14 (2006) pp. 1468-1475

41) Schuster, T.; Kauffmann, J.; Kerwien, N.; Tiziani, H. J.; Osten, W.; Reinig, P.Qimonda, Dresden, "Scatterometrie an Kreuzgitterstrukturen", DGaO Proceedings 2006, 107. Tagung, ”http://www.dgao-proceedings.de” ISSN: 1614-8436, 2006

42) Shuster, T.; Kerwien, N.; Rafler, S.; Osten, W.; Ruoff, J., "Convergence improvement for the RCWA considering crossed gratings using normal vector fields", 4th IISB Lithography Simulation Workshop 29.09.-01.10.2006, Hersbruck, 2006

43) Schwab, X.; Meister, E.; Pedrini, G.; Osten, W., "Alignment of master and sample in comparative digital holography", Proc. SPIE, Vol. 6341, 63410Y, Speckle06: Speckles, From Grains to Flowers; Pierre Slangen, Christine Cerruti; Eds., 2006

44) Seifert, L.; Ruppel, T.; Haist, T.; Osten, W., "Wavefront sensing by an aperiodic microlens array", SPIE 2006 - San Diego, Proc. SPIE, Vol. 6293, 629302, 2006

45) Wiesendanger, T.; Regin, J.; Pannekamp, J.; Westkämper, E.; Osten, W., "Strategies for high resolution functional defect recognition on laterally large extended micromechanical and micro optical objects", MFI 2006 International Conference on Multisensor Fusion and Integration for Intelligent Systems, September 3-6, Heidelberg, Germany, 2006

46) Zhang, F.; Pedrini, G.; Osten, W., "Image formation in digital holography", Proc. SPIE, Vol. 6188, 618812, Optical Micro- and Nanometrology in Microsystems Technology; Christophe Gorecki, Anand K. Asundi, Wolfgang Osten; Eds., 2006

47) Zhang, F.; Pedrini, G.; Osten, W., "Aberration-free reconstruction algorithm for high numerical aperture digital hologram", Proc. SPIE, Vol. 6188, 618814, Optical Micro- and Nanometrology in Microsystems Technology; Christophe Gorecki, Anand K. Asundi, Wolfgang Osten; Eds., 2006

48) Zhang, Y.; Zheng, D. X.; Sheng, J. L.; Zhang, C. L.; Pedrini, G., "Iterative reconstruction of wave front from an in-line hologram sequence", Proc. SPIE, Vol. 6027, 602729, ICO20: Optical Information Processing; Yunlong Sheng, Songlin Zhuang, Yimo Zhang; Eds., 2006

49) Zhang, F.; Pedrini, G.; Osten, W., "Reconstruction algorithm for high-numerical-aperture holograms with diffraction-limited resolution", Optics Letters 31 (2006) 11 pp. 1633-5

50) Zhang, F.; Pedrini, G.; Osten, W., "Reply to comment on "Reconstruction algorithm for high-numerical-aperture holograms with diffraction-limited resolution", Optics Letters 31 (2006) 19 pp. 2848

Publikationen 2005

1) Berger, R.; Kerwien, N.; Osten, W., "The Chirp-Z-Transform in Digital Holography", Journal of Holography and Speckle, Vol. 2 (2005) pp. 1-4

2) Haist, T.; Pruss, C.; Osten, W., "Computer-generated holograms", Themenheft Forschung No.2 - 2005, Photonics, pp. 44-49, ISSN 1861-0269, 2005

3) Haist, T.; Reicherter, M.; Burla, A.; Seifert, L.; Bear, A.; Osten, W., "Fast hologram computation for holographic tweezers", In FRINGE 2005, Proceedings of the 5th International Workshop on Automatic Processing of Fringe Patterns, W. Osten, ed., Springer-Verlag Heidelberg, 2005, pp. 126-133, 2005

4) Haist, T.; Reicherter, M.; Zwick, S.; Burla, B.; Seifert, L.; Bear, A.; Osten, W., "Fast hologram computation and aberration control for holographic tweezers", Proc. SPIE, Vol. 5930, pp. 501-509, Optical Trapping and Optical Micromanipulation II; Kishan Dholakia, Gabriel C. Spalding; Eds. Publication, August 2005, 2005

5) Kauffmann, J.; Bader, J.; Kerwien, N.; Osten, W.; Tiziani, H. J., "Polarisation Measurements on Diffractometry for optical Nanostructures", Nanofair 2005, Dresden. New Ideas for Industry, VDI-Bericht 1920, 2005 ISBN 3-18-091920-5, 2005

6) Kerwien, N.; Osten, W.; Tiziani, H. J., "Polarization effects in high resolution optical metrology", Proc. of the EOS Topical Meeting on Advanced Imaging Techniques, London, 2005

7) Kopylow, C. v.; Baumbach, T.; Osten, W.; Jüptner, W., "Comparative Digital Holography for application in Quality Assurance during Production", Production Engineering 12 (2005) 1, pp. 137-142

8) Körner, K.; Ruprecht, A. ; Wiesendanger, T., "Mikroskopische Techniken", VDI- Wissensforum Optische Verfahren für die zerstörungsfreie Werkstoffprüfung, Airbus Bremen am 02.06.2005, 2005

9) Liesener, J.; Osten, W., "Wavefront Optimization using Piston Micro Mirror Arrays", In FRINGE 2005, Proceedings of the 5th International Workshop on Automatic Processing of Fringe Patterns, W. Osten, ed., Springer-Verlag Heidelberg, 2005, pp. 150-157, 2005

10) Liesener, J.; Seifert, L.; Reicherter, M., "Sophisticated Light Switches", ASPE (American Society for Precision Engineering) 2005 Summer Topical Meeting, pp. 45-50, Vol. 36, ISBN 1-887706-38-0, Precision Interferometric Metrology, July 20-22, 2005

11) Lücke, P.; Last, A.; Mohr, J.; Ruprecht, A. K.; Pruss, C.; Tiziani, H. J.; Osten, W.; Lehmann, P.; Schonfelder, S., "Confocal micro-optical distance sensor: realization and results", Optical Measurement Systems for Industrial Inspection IV. Munich, Germany. 13 June 2005, SPIE, Vol. 5856, pp. 136-142, 2005

12) Martinez-Leon, L.; Pedrini, G.; Osten, W., "Applications of short-coherence digital holography in microscopy", Applied Optics 44 (2005) 19 pp. 3977-84

13) Osten, W., "Resolution enhanced technologies in optical metrology", DGaO Proceedings 2005, 106. Tagung, “http://www.dgao-proceedings.de” ISSN: 1614-8436, 2005

14) Osten, W., "Stand und Perspektiven der streifenbasierten optischen Messtechnik", Photonik 4/2005, ISSN: 1432-9778, pp. 48-52, 2005

15) Osten, W.; Kerwien, N., "Optische Messtechnik an den Grenzen zwischen Makro und Nano", Wechselwirkungen 2005, Jahrbuch aus Lehre und Forschung der Universität Stuttgart, ISSN 0724-3324, pp. 50-69, 2005

16) Osten, W.; Kerwien, N., "Resolution enhancement technologies in optical metrology", Proceedings of 8th International Symposium on Laser Metrology - Macro-, micro-, and nano-technologies applied in science, engineering and industry, Merida, Mexico (2005) Proc. SPIE, Vol. 5776, pp. 10-21, 2005

17) Osten, W.; Kohler, C.; Liesener, J., "Evaluation and application of spatial light modulators for optical metrology", In: I. Moreno (Ed.): Proc. 4th Reunion Espagnola de Optoelectronica OPTEL´05, pp. 71-81, 2005

18) Osten, W.,"Digital Holography", In: Encyclopedia of Modern Optics. Elsevier Ltd. (2005), pp. 79-88

19) Osten, W.; Kohler, C.; Liesener, J., "Evaluation and Application of Spatial Light Modulators for Optical Metrology", Opt. Pur. y Appl. 38 (2005) 3, pp. 71-81

20) Papastathopoulos, E.; Körner, K.; Osten, W., "Chromatic confocal spectral interferometry-(CCSI)", In FRINGE 2005, Proceedings of the 5th International Workshop on Automatic Processing of Fringe Patterns, W. Osten, ed., Springer-Verlag Heidelberg, 2005, pp. 694-701, 2005

21) Pedrini, G.; Alexeenko, I.; Zaslansky, P.; Osten, W.; Tiziani H. J., "Digital holographic interferometry for investigations in biomechanics", Proc. SPIE, Vol. 5776, pp. 325-332, 2005

22) Pedrini, G.; Osten, W.; Zhang, Y., "Wave-front reconstruction from a sequence of interferograms recorded at different planes", Optics Letters 30 (2005) 8 pp. 833-5

23) Pruss, C.; Ruprecht, A.; Körner, K.; Osten, W.; Lücke, P., "Diffractive Elements for Chromatic Confocal Sensors", DGaO Proceedings 2005, 106. Tagung,“http://www.dgao-proceedings.de” ISSN: 1614-8436, 2005

24) Reicherter, M.; Zwick, S.; Gorski, W.; Haist, T., "Aberration control in holographic tweezers using image processing", Conference on Lasers and Electro-Optics Europe. Munich, Germany. 12-17 June 2005, 2005

25) Reichle, R.; Pruss, C.; Osten, W.; Tiziani, H. J.; Zimmermann, F.; Schulz, C., "Fiber optic spark plug sensor for UV-LIF measurements close to the ignition spark", Optical Measurement Systems for Industrial Inspection IV. Munich, Germany. 13 June 2005. Proc. SPIE, Vol. 5856, pp. 158-168, 2005

26) Ruprecht, A. K.; Pruss, C.; Tiziani, H. J.; Osten, W.; Lücke, P.; Last, A.; Mohr, J.; Lehmann, P., "Confocal micro-optical distance sensor: principle and design", Optical Measurement Systems for Industrial Inspection IV. Munich, Germany. 13 June 2005, SPIE, Vol. 5856, pp. 128-135, 2005

27) Ruprecht, A. K.; Körner, K.; Wiesendanger, T. F.; Tiziani, H. J.; Osten, W., "Chromatic confocal sensors for micro-topography measurements", Electronische Proceedings des “50. Internationales Kolloquium der TU Ilmenau“, Reihe 5.2 Optische Messverfahren, 2005

28) Schuster, T.; Kerwien, N.; Osten, W.; Reinig, P.; Moert, M.; Hingst, T.; Mantz, U., "Effect of linewidth fluctuations and sidewall roughness in scatterometry", Conference on Lasers and Electro-Optics Europe. Munich, Germany. 12-17 June 2005, 2005

29) Schedin, S.; Pedrini, G.; Perez-Lopez, C.; Mendoza Santoyo, F., "Vibration measurements by pulsed digital holographic endoscopy", Proc. SPIE, Vol. 5776, pp. 729-734, 2005

30) Seifert, L.; Tiziani, H. J.; Osten, W., "Wavefront reconstruction algorithms for the adaptive Shack-Hartmann sensor", Optical Measurement Systems for Industrial Inspection IV. Munich, Germany. 13 June 2005. Proc. SPIE, Vol. 5856, pp. 544-553, 2005

31) Seifert, L.; Tiziani, H. J.; Osten, W., "Wavefront reconstruction with the adaptive Shack-Hartmann sensor", Optics Communications 245 (2005) pp. 255-69

32) Tavrov, A.; Schmit, J.; Kerwien, N.; Osten, W.; Tiziani, H. J., "Diffraction-induced coherence levels", Applied Optics 44 (2005) 11 pp. 2202-12

32) Tiziani, H. J.; Liesener, J.; Pruss, C.; Reichelt, S.; Seifert, L., "Active wavefront shaping and analysis", Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments III. Edited by Romaniuk, Ryszard S., Proc. SPIE, Vol. 5776, pp. 1-9, 2005

33) Wiesendanger, T.; Osten, W.; Pannekamp, J.; Regin, J.; Westkämper, E., "Neue multiskalige Mess- und Prüfstrategien für die Produktion von Mikrosystemen", In: Mikrosystemtechnik Kongress 2005. GMM, VDE, VDI, (eds.), VDE Verlag Berlin, Germany; pp. 677-680, 2005

34) Zhang, Y.; Pedrini, G.; Osten, W.; Tiziani, H. J., "Reconstruction of in-line holograms using phase retrieval algorithms", Physica Scripta 2005(T118) (2005) pp. 102-6

35) Zheng, D. X.; Zhang, Y.; Shen, J. L.; Zhang, C. L.; Pedrini, G. "Wave field reconstruction from a hologram sequence", Optics Communications 249 (2005) pp. 73-77

Publikationen 2004

1) Alexeenko, I.; Pedrini, G.; Zaslansky, P.; Kuzmina, E.; Osten, W.; Weiner, S. ," Digital holographic interferometry for the investigation of the elastic properties of bone Advances in Mechanics edited by Carmine Pappalettere". pp. 458-459, McGraw-Hill, Milano, 2004

2) Baumbach. T.; Osten, W.; Kebbel, V.; Kopylow, C.; Jüptner, W. ," Set-up calibration and optimization for comparative digital holography". Proc. SPIE Vol. 5532, pp. 16-27, 2004

3) Baumbach. T.; Osten, W.; Kopylow, C.; Jüptner, W. ," Application of comparative digital holography for distant shape control". Proc. SPIE Vol. 5457, pp. 598-609, 2004

4) Berger, R.; Kauffmann, J.; Kerwien, N.; Osten, W.; Tiziani, H.J. ," Rigorose Beugungssimulation: Ein Vergleich zwischen RCWA, FDTD und der Finiten Elemente Methode". Poster P59, 105. Jahrestagung der Deutschen Gesellschaft für angewandte Optik (DGaO) Bad Kreuznach, 2004

5) Falldorf, C.; Kopylow, C.; Osten, W.; Jüptner, W.," Digital holography and grating interferometry: a complementary approach". Proc. SPIE Vol. 5457, pp. 225-231, 2004

6) Kauffmann J.; Kerwien N.; Tiziani, H.J.; Osten W. ," 3D anisotropy reconstruction: an iterative tensorial tomographic algorithm". Proceeding der ICO, pp.615-616, Tokyo, 2004

7) Kauffmann, J.; Kerwien, N.; Osten, W.; Tiziani, H.J. ," Ein tomographisches Verfahren zur Rekonstruktion der volumenaufgelösten Verteilung des Brechungsindextensors". 105. Jahrestagung der Deutschen Gesellschaft für angewandte Optik (DGaO) Bad Kreuznach, 2004

8) Kayser, D.; Bothe, Th.; Osten, W. ,"Scaled topometry in a multisensor approach", Optical Engineering 43 (2004) 10 pp. 2469 – 2477

9) Kerwien, N.; Kauffmann, J.; Osten, W.; Tiziani, H.J.; Meining, S. ," Polarisations-Mikroskopie im DUV". 105. Jahrestagung der Deutschen Gesellschaft für angewandte Optik (DGaO) Bad Kreuznach, 2004

10) Körner, K.; Droste, U.; Schuster, Th.; Osten W. ," Depth-scanning Techniques in Optical 3-D Metrology". VDI-Berichte Nr. 1844, pp.339-348, 2004

11) Körner, K; Ruprecht, A.; Wiesendanger, T. ," 3D-Messtechnik in der mikroskopischen Skala". 3D-Nordost 2004, Tagungsband: 7. Anwendungs-bezogener Workshop zur Erfassung, Verarbeitung, Modellierung und Auswertung von 3D-Daten, Berlin, ISBN: 3-9809212-0-2,pp. 19-26, 2004

12) Körner, K.; Ruprecht, A. K.; Wiesendanger, T. F. ," New approaches in depth-scanning optical metrology ". Proc. SPIE Vol. 5457, pp. 320-333, 2004

13) Li, W.; Bothe, Th.; Osten, W.; Kalms, M.," Object adapted pattern projection – Part I: Generation of inverse patterns". Optics and Lasers in Engineering 41(2004) pp. 31-50

14) Liesener, J.; Hupfer, W.J.; Gehner,A.; Wallace, K. ," Tests on micromirror arrays for adaptive optics ". SPIE Annual Meeting 2004 Denver . Proc. SPIE Vol. 5553, pp. 319-329, 2004

15) Liesener, J. ; Pruß, C.; Tiziani, H.J.; Osten, W. ," Array of phase-shifting point sources ". MOC 04 Jena, Paper L61 + Poster, 2004

17) Liesener, J.; Tiziani, H.J. ," Interferometer with dynamic reference ". Proc. SPIE Vol. 5252, pp. 264-271, 2004

18) Martinez-Leon, L.; Pedrini, G.; Osten, W. ," Short-coherence digital holography for the investigation of 3D microscopic samples ". Proc. SPIE Vol. 5457, pp. 528-537, 2004

19) Nivet J.-M.; Schuster, T.; Körner, K.; Droste, U.; Osten, W. ," A new calibration scheme for three-dimensional depth-scanning fringe projection mesurement method ".Proc. SPIE Vol. 5457, pp. 334-343, 2004

20) Osten, W. ," Mehr Präzision und Sicherheit durch Lasermesstechnik". Lasertechnik Journal Oktober 2004, S. 40-45

21) Osten, W. ," Optics: Old questions! New answers?" Proc. Int. Colloquium "Optics – Key Technology for the Future", November 17 – 18, 2004, Aachen, Germany, pp. 3-10

22) Osten, W.; Totzeck, M. ," Optics beyond the limits: The future of high precision optical metrology and implications for optical lithography ". Proc. ICO 2004, Tokyo 2004, pp. 589-592

23) Pedrini, G.; Alexeenko, I. ," Miniaturised optical system based on digital holography ". Proc. SPIE, Vol. 5503, pp. 493-498, 2004

24) Proll, K.-P.; Kohler, C; Körner, K.; Osten, W. ," Adaptive Microscopic 3-D Measurement with Liquid-Crystal Spatial Light Modulators ". Photon 04 FASIG 3: Optical testing and New algorithms, Glasgow, 2004

25) Proll, K.-P.; Kohler, C.; Baumbach, T.; Osten, W.; Osten; S.; Gruber, H.; Langner, A.; Wernicke, G. ," Optical characterization of liquid-crystal-on-silicon displays ". Proc. SPIE Vol. 5457, pp.632-642, 2004

26) Pruss, C.; Tiziani, H.J. ," Dynamic null lens for aspheric testing using a membrane mirror". Optics Communications 233 (2004) pp. 15-19

27) Pruss, C.; Reichelt, S.; Tiziani, H. J.; W. Osten, " Computer generated holograms in interferometric testing". Optical Engineering 43 (2004) 11 pp. 2534-2540

28) Reichle, R.; Pruss, C.; Osten, W.; Tiziani, H.J.; Zimmermann, F.; Schulz, E. ," Microoptical sensor for integration in a functional spark plug for combustion analysis by UV-laser induced fluorescence spectroscopy ". Proc. VDI 4th Conference on Optical Analysis Technology, 2004; 23/24. Juni, Frankfurt

29) Reinig, P.; Dost, R.; Mört, M.; Hingst, T.; Mantz U.; Schuster, T.; Kerwien, N.; Kaufmann, J.; Osten W. ," Potential and limits of scatterometry: A study on bowed profiles and high aspect ratios ". Scatterometry Workshop 2004, 3.-5.5.2004 Porquerolles, Frankreich

30) Reicherter, M.; Gorski, W.; Haist, T.; Osten, W. ," Dynamic correction of aberrations in microscopic imaging systems using an artificial point source ". Proc. SPIE Vol. 5462, pp. 68-78, 2004

31) Ruprecht, A. K.; Körner, K.; Wiesendanger, T. F.; Tiziani, H. J.; Osten, W. ," Chromatic confocal detection for high speed micro-topography measurements ". Three-Dimensional Image Capture and Applications VI . San Jose, CA, USA. 19-20 Jan. 2004 . Proc. SPIE Vol. 5302-6, no.1, pp. 53-60, 2003

32) Ruprecht A.K.; Proll K.-P.; Kauffmann J.; Tiziani H.J.; Osten, W. ," Multi Wavelenght Systems in Optical 3-D Metrology ".6th Int’l Conference for Optical Technologies, Optical Sensors and Measuring Techniques (OPTO 2004), Nürnberg, 25.-27. Mai 2004, pp. 101-106

33) Ruprecht, A. K.; Wiesendanger, T. F.; Tiziani, H.J ," Chromatic confocal microscopy with a finite pinhole size". Optics Letters 29 (2004) pp. 2130-2132

34) Seifert, L.; Liesener,J., Tiziani, H. J.; Osten,W. ," Adaptive Shack-Hartmann Sensor . MOC 04 Jena, Paper L62 + Poster, 2004

35) Wiesendanger, T., Körner, K., Ruprecht, A., Tiziani, H.J., Osten, W. ," Fast confocal point-sensor for in-process control of laser welding ". ISMQ2004, 8th International Symposium on Measurement and Quality Control in Production, Erlangen, Germany, 2004. Proc. of Intl. Conf. on Laser Applications and Optical Metrology. Editor C.Shakher and D:S: Mehta, pp. 336-339

36) Wiesendanger, T.; Ruprecht, A.; Körner, K.; Tiziani, H.J.; Osten, W. ," Konfokaler Sensor zur Messung der Einschweißtiefe im Keyhole ". 105. Jahrestagung der Deutschen Gesellschaft für angewandte Optik (DGaO) Bad Kreuznach, 2004

37) Yasuno, Y., Wiesendanger, T., Ruprecht, A., Makita, S., Yatagai, T., and Tiziani, H.J., "Wavefront-flatness evaluation by wavefront-correlation-information-entoropy method and its application for adaptive confocal microscope", Optics Communications 232 (2004) pp.91-97.

38) Zaslansky, P.; Pedrini, G.; Alexeenko, I.; Osten, W.; Friesem, A.; Weiner, S.; Shahar, R.," Static and dynamic interferometric measurements used to determine mechanical properties of cortical bone ". Advances in Mechanics edited by Carmine Pappalettere, pp. 76-77, McGraw-Hill, Milano, 2004

39) Zhang, Y.; Pedrini, G.; Osten, W.; Tiziani, H. ," Applications of fractional transforms to object reconstruction from in-line holograms". Optical Letters 29 (2004) 15 pp. 1793 – 1795

40) Zhang, Y.; Pedrini, G.; Osten, W.; Tiziani, H. ,"Phase retrieval microscopy for quantitative phase-contrast imaging". Optik 115 (2004) 2 pp. 94-96

41) Zhang, Y., Pedrini, G., Osten, W., Tiziani, H. J . ," Reconstruction of in-line digital holograms from two intensity measurements". Optics Letters 29 (2004) 15 pp. 1787

Publikationen 2003

1) Alexeenko, I.; Gusev, M.; Pedrini, G.; Tiziani, H.J. ," The applying of stroboscopic holographic interferometry to frequency-bounded vibrational investigation" . Proc. SPIE, Int.Soc.Opt.Eng. Vol. 5134, pp.29-35, 2003

2) Berger, R.; Bohr, R.; Kerwien, N.; Pedrini, G.; Osten, W.; Tiziani, H.J. ," Digitale holografische Interferometrie im DUV" . 104. Jahrestagung der Deutschen Gesellschaft für angewandte Optik (DGaO) Münster, 2003

3) Bodermann, B.; Mirandé, W.; Kerwien, N.; Tavrov, A.; Totzeck, M.; Tiziani, H.J. ," Comparative linewidths measurements on Chrome and MoSi structures using newly developed microscopy methods" . Recent Developments in Traceable Dimensional Measurements II , J. E. Decker, N. Brown .Proc. SPIE, Vol 5188, pp.320-330, 2003

4) Falldorf, C.; Hanson, S.; Osten, W.; Jüptner, W. ," Fringe compensation in multiband speckle shearography using a wedge prism" . Proc. SPIE Vol. 4933, pp. 82-89, 2003

5) Falldorf, C.; Osten, W.; Kolenovic, E. ,"Speckle shearography using a multiband light source" . Optics and Lasers in Engineering 40 (2003) pp. 543-552

7) Franz, S.; Windecker, R.; Tiziani, H.J. ," Machine tool embedded white light interferometrical sensor for diameter measurements" . Proc. SPIE, Vol. 5144, pp. 484-491, 2003

8) Gusev, M.; Alexeenko, I.; Pedrini,G.; Tiziani, H.J. ," Mode shape separation in stroboscopic and double-pulse holographic analysis" . Proc. SPIE, Vol. 5134, pp.36-42, 2003

9) Gusev, M.; Pedrini, G.; Alexeenko, I.; Tiziani, H.J., Malov, A. ," Application of stroboscopic and double-pulse holographic interferometry to frequensy-bounded vibrational investigation" . Proc. SPIE, Vol. 5129, pp.80-91, 2003

10) Haist, T.; Osten, W.; Reicherter, M.; Liesener, J., Seifert, L. ," Dynamic holography and its application in measurement systems" . Proc. SPIE Vol. 5202, pp.131-142, 2003

11) Kalms, M.; Osten, W.," Mobile shearography system for the inspection of aircraft and automotive component". Opt. Eng.42.,5, 1188-1196., 2003.

12) Kauffmann, J.; Gahr, M.; Tiziani, H.J. ," Noise reduction in speckle pattern interferometry in Speckle Metrology 2003", Gastinger K., Lokberg J., Winter, S., eds . Proc. SPIE Vol. 4933, pp. 9-14 , 2003

14) Kerwien, N.; Rosenthal, E.; Tavrov, A.; Tiziani, H.J. Hochaufgelöste Strukturerkennung mittels Müllermatrix-Mikroskopie. 104. Jahrestagung der Deutschen Gesellschaft für angewandte Optik (DGaO) Münster, 2003

15) Kerwien, N.; Rosenthal, E.; Totzeck, M.; Osten, W.; Tiziani, H.J. ," Mueller matrix microscopy for high-resolution inspection of 2D-microstructures EOS Topical Meeting Advanced Imaging Techniques", Delft, 2003

16) Kerwien, N.; Tavrov, A.; Kauffmann, J.; Osten, W.; Tiziani, H.J. ," Rapid quantitative phase imaging using phase retrieval for optical metrology of phase-shifting masks Optical Measuremt Systems for Industrial Inspection III", W. Osten, K. Creath, M. Kujawinska Proc. SPIE, Vol 5144 , pp. 105-114, 2003

18) Klattenhoff, R.; Kolenovic, E.; Osten, W.; von Kopylow, C.; Jüptner, W. ," Miniaturized sensor head for distal holographic endoscopy" . Proc. SPIE Vol 5145, pp. 137-145, 2003

20) Kolenovic, E.; Osten, W.; Klattenhoff, R.; Lai, S.; Kopylow, C.; Jüptner, W. ," Miniaturized digital holography sensor for distal three-dimensional endoscopy" . Applied Optics 42 (2003) 25 pp. 5167-5172

21) Kolenovic, E.; Osten, W.; Jüptner, W. ," Improvement of interferometric phase measurements by consideration of the speckle field topology" . Proc. SPIE Vol. 4933, pp. 206-211, 2003

22) Leonhardt, K., Droste, U., Tiziani, H.J., "Interferometry for Ellipso-Height-Topometry-Part 1: Coherence scanning on the base of special coherence", Optik, Vol. 113 (12), S. 513-519, 2003.

23) Leonhardt K.; Droste U.; Tiziani H. J. ," Interferometry for Ellipso-Height-Topometry-Part 1: Coherence scanning on the base of special coherence". Optik 113 (2003) 12 pp. 513-519

25) Liesener, J.; Seifert, L.; Schoder, T.; Tiziani, H.J. ," Interferometer mit dynamischer Referenz ". Poster 104 Jahrestagung der Deutschen Gesellschaft für angewandte Optik (DGaO) Münster, 2003

26) Nivet, J.-M.; Körner, K.; Droste, U.; Fleischer, M.; Tiziani, H.J.; Osten, W. ," Tiefenscannende Streifenprojektionstechnik (DSFP) mit 3D-Kalibrierung" . 3D-Nordost 2003, Tagungsband: 6. Anwendungs-bezogener Workshop zur Erfassung, Verarbeitung, Modellierung und Auswertung von 3D-Daten, Berlin, ISBN: 3-9809212-0-4,pp. 21-30, 2003

27) Nivet, J.-M., Körner, K., Droste, U., Fleischer, M., Tiziani, H.J., Osten, W., "Depth-scanning fringe projection technique (DSFP) with 3-D calibration", akzeptiert für die Veröffentlichung in: Optical Measurement Systems for Industrial Inspection III, Proceeding of SPIE Vol. 5144.

28) Osten, W. ," Active metrology by digital holography" . Proc. SPIE Vol. 4933, pp. 96-110, 2003

29) Osten, W.; Haist, T.; Körner, K ," Active approaches in optical metrology" . Proc. Int. Conf. On Laser Applications and Optical Metrology, New Delhi 2003, pp. 9-19

30) Osten, W.; Kolenovic, E.; Klattenhoff, R.; Köpp, N. ," Optimized interferometer for 3D digital holographic endoscopy" . Proc. SPIE Vol 5144, pp. 150-161, 2003

32) Pedrini, G., Alexeenko, I., Osten, W., Tiziani, H.J., "Temporal Phase Unwrapping of Digital Holograms Sequences", Applied Optics, April 2003.

33) Pedrini, G., Alexeenko, I., Tiziani, H.J., "Pulsed endoscopic digital holographic interferometry for investigation of hidden surfaces", Proc. SPIE, Februar 2003.

34) Pedrini, G., Gusev, M., Schedin, S., Tiziani, H. J., "Pulsed digital holographic interferometry by using a flexible fiber endoscope", Optics and Lasers in Engineering, Dezember 2003.

35) Proll, K.-P., Nivet, J.-M., Körner, K., Tiziani, H.J., „Application of a ferroelectric liquid-crystal-on-silicon display in fringe projection setups", als Vortrag akzeptiert zur SPIE-Konferenz „Optical Measurement Systems for Industrial Inspection", München, 23.-27.06.2003, Veröffentlichung erfolgt in den Proceedings of the SPIE 5144.

36) Proll, K.-P., Nivet, J.-M., Körner, K., Tiziani, H.J., "Microscopic three-dimensional topometry with ferroelectric liquid-crystal-on-silicon displays", Applied Optics, Vol. 42 (10), S. 1773-1778, 2003.

37) Pruss, C., Reichelt, S., Korolkov, V.P., Osten, W., Tiziani, H.J., "Performance improvement of CGHs for optical testing,", Proc. SPIE, issue date June 2003.

38) Pruß, C.; Reichelt, S.; Korolkov, V.P. ," Diffraktives Interferometerobjektiv. Design, Realisierung, Performance" . 104. Jahrestagung der Deutschen Gesellschaft für angewandte Optik (DGaO) Münster, 2003

39) Reichelt, S., Pruss, C., Tiziani, H.J., "Absolute interferometric test of aspheres by use of twin computer-generated holograms", Applied Optics, Vol. 42 (22), issue date 08/01/2003.

40) Reicherter, M., Liesener, J., Haist, T., Tiziani, H.J., "Advantages of Holographic Optical Tweezers", Proceeding SPIE, Juni 2002.

41) Reichelt, S., Tiziani, H.J., "Twin-CGHs for absolute calibration in wavefront testing interferometry", Optics Communications, Vol. 220, S. 23-32, May 2003.

42) Reichelt, S.; Tiziani, H.J. ," Twin-GGHs for absolute calibration in wavefront testing interferometry" . Optics Communications 220 (2003) 1 pp. 23-32

43) Reichelt, S.; Pruss, C.; Tiziani, H. J. ," Absolute testing of aspheric surfaces" . In Geyl, R. and Rimmer, D. editors, Optical Fabrication, Testing, and Metrology . Proc. SPIE, Vol. 5252, pp. 252-263, 2003

44) Reicherter, M.; Liesener, J.; Haist, T.; Tiziani, H.J ," Flexible Fallengeometrie bei der holografischen Pinzette" . 104 Jahrestagung der Deutschen Gesellschaft für angewandte Optik (DGaO) Münster, 2003

45) Ruprecht, A.; Wiesendanger, T.; Tiziani, H.J.; Osten, W. ," Auflösungssteigerung in einem chromatisch-konfokalen Mikroskop" . 104 Jahrestagung der Deutschen Gesellschaft für angewandte Optik (DGaO) Münster, 2003

46) Seifert, L.; Liesener, J.; Tiziani, H.J. ," Der adaptive Shack-Hartmann Sensor zur Vermessung von Gleitsichtgläsern" .Poster 104. Jahrestagung der Deutschen Gesellschaft für angewandte Optik (DGaO) Münster, 2003

47) Seifert, L., Liesener, J., Tiziani, H.J., "The adaptive Shack-Hartmann sensor", Optics Communications, Vol. 216, S. 313-319, 2/2003.

48) Seifert, L., Liesener, L., Tiziani, H.J., "Adaptive Shack-Hartmann sensor", Proceedings of the SPIE, Vol. 5144, 2003.

49) Tavrov, A.; Kerwien, N.; Berger, R.; Tiziani, H.J., Totzeck., M,; Spektor, B.; Shamir, J.; Toker, G.; Brunfeld, A. ," Vector simulations of dark beam interaction with nano-scale surface features" . Optical Measuremt Systems for Industrial Inspection III, W. Osten, K. Creath, M. Kujawinska Proc. SPIE, Vol 5144 , pp. 26-36, 2003

50) Wiesendanger, T., Körner, K., Ruprecht, A., Windecker, R., Tiziani, H.J., Osten, W., "Fast confocal point-sensor for in-process control of laser welding", Interntional Conference on Laser Applications and Optical Metrology (ICLAOM´03), New Delhi, 1.12-4.12.2003, submitted 2003.

51) Wiesendanger, T., Yasuno, Y., Ruprecht, A., Yatagai, T., Tiziani, H.J., "Characterization of microoptic arrays by evaluation of the axial confocal response", Optical Review, (submitted 2003).

52) Wiesendanger, T.F.; Körner, K.; Ruprecht, A.; Windecker, R.; Tiziani, H.; Osten, W. ," Fast confocal point sensor for in-process control of laser welding" . Proc. Int. Conf. On Laser Applications and Optical Metrology, New Delhi 2003, pp. 336-339

53) Wiesendanger,T.; Yasuno, Y. ;Ruprecht, A.; Tiziani, H.J. ," Konfokale Mikroskopie mit einem adaptivem Spiegel" . 104. Jahrestagung der Deutschen Gesellschaft für angewandte Optik (DGaO) Münster, 2003

54) Yasuno, Y., Makita, S., Yatagai ,T., Wiesendanger, T.F., Ruprecht, A.K., and Tiziani, H.J., "Non-mechanically-axial-scanning confocal microscope using adaptive mirror switching", Opt. Express, 11, S. 54-60, 2003.

55) Yasuno, Y.; Wiesendanger, T.; Ruprecht, A.; Yatagai, T.; Tiziani H.J. ," Determination of Aberration Coefficient of Microoptic Arrays from Axial Confocal Response by Neural Method" . Optical Review 10 (2003) pp. 318-320

56) Zhang, Y., Pedrini, G., Tiziani, H.J., Osten, W., "Image reconstruction for in-line holography using Yang-Gu algorithm", Applied Optics.42 (2003) 32 pp. 6452

57) Zhang, Y.; Pedrini, G.; Osten, W.; Tiziani, H. J. ," Whole optical wave field reconstruction from double or multi in-line holograms by phase retrieval algorithm" . Optics Express 11 (2003) 24 pp. 3234

Publikationen 2002

2) Bothe, Th.; Li, W., Osten, W.; Jüptner, W.," Generation and evaluation of object adapted inverse fringe patterns. Proc. Intern Symposium Photonics in Measurement". VDI-Berichte 1694, Düsseldorf .,pp. 299-304.,2002.

3) Bothe, Th.; Osten, W.; Gesierich, A.; Jüptner, W.," Compact 3D-Camera". Proc. SPIE Vol. 4778.,pp. 48-59

5) Elandaloussi, E.; Osten, W.; Jüptner, W.," Detektion und Analyse von Materialfehlern nach dem Prinzip „Erkennung durch Synthese"". Technisches Messen, 5.,227-235.,2002.

7) Falldorf, C.; Osten, W.; Kolenovic, E.; Jüptner, W.," Features of multiband speckle shearography". SPIE Vol. 4900.,1262-1269.,2002.

8) Haist, T.; Tiziani, H.J. ," Color-coded object-adapted fringe projection for two- and three-dimensional quality control ".Technisches Messen 69 (2002) pp.367-73

9) Kallmeyer, F.; Krüger, S.; Wernicke, G.; Gruber, H.; Osten, W.; Kayser, D.; Demoli, N.," Optical processing of interferometric fringes and detection of faults by Wavelet filtering". Proc. Intern Symposium Photonics in Measurement. VDI-Berichte 1694, Düsseldorf .,pp. 35-40.,2002.

10) Kallmeyer, F.; Krüger, S.; Wernicke, G.K.; Gruber, H.; Demoli, N.; Osten, W.; Kayser, D.," Optical processing fort he detection of faults in interferometric patterns". Proc. SPIE Vol. 4777.,371-381.,2002.

11) Kalms, M.; Osten, W.; Jüptner, W.," Scherografie – die Umsetzung des Prinzips in ein mobiles Prüfsystem. Technisches Messen", 5.,217-226.,2002.

12) Kauffmann, J.; Tiziani, H.J., "Temporal Speckle Pattern Interferometry for Vibration Measurement", Proc. SPIE, Vol. 4827, S. 133-136, Vibration Measurement by Laser Techniques: Advances and Applications, 2002.

13) Kayser, D.; Bothe, Th.; Osten, W.," Scaled multisensor inspection of extended surfaces for industrial quality control". Proc. SPIE Vol. 4777.,242-250.,2002.

14) Kayser, D.; Bothe, Th.; Osten, W.," An integrated measurement system for the inspection of extended surfaces in industrial quality control. Proc. Intern Symposium Photonics in Measurement". VDI-Berichte 1694, Düsseldorf .,pp. 339-344.,2002.

15) Kerwien, N.; Totzeck, M.; Tavrov, A.; Tiziani, H.J. ," Hochauflösender quantitativer Nomarski Interferenzkontrast mit Polarisationskorrektur" .103. Jahrestagung der Deutschen Gesellschaft für angewandte Optik (DGaO) Innsbruck , 2002

16) Kolenovic, E.; Lai, S.; Osten, W.; Jüptner, W.," A miniaturized digital holographic endoscopic system for shape and deformation measurement". Proc. Intern Symposium Photonics in Measurement. VDI-Berichte 1694, Düsseldorf .,pp. 79-84.,2002.

18) Lai, S.; Kolenovic, E.; Osten, W.; Jüptner, W.," A deformation and 3D-shape measurement system based on phase-shifting digital holography". Proc. SPIE Vol. 4537.,p. 273-276.,2002.

19) Legarda Saenz, R.; Osten, W.; Jüptner, W.," Improvement of the regularized phase tracking technique for the processing of non-normalized fringe patterns". Appl. Opt. 41.,26, 5519-5525.,2002.

20) Liesener, J.; Seifert, L.; Tiziani, H.J. ," Adaptiver Shack-Hartmann-Sensor mit LCD-Mikrolinsen Poster", 103. Jahrestagung der Deutschen Gesellschaft für angewandte Optik (DGaO) Innsbruck , 2002

21) Osten.W, Th. Baumbach, W. Jüptner," Comparative Digital Holography". Optics Letters, 27.,20, 1764-1766.,2002.

22) Osten, W.; Elandaloussi, F.; Mieth, U.," Trends for the solution of identifikation problems in holographic non-destructive testing (HNDT)". SPIE Vol. 4900.,1187-1196.,2002.

23) Osten, W.; Baumbach, Th.; Falldorf, C.; Kalms, W.; Jüptner, W.," Some progress with the implementation of a shearography system for the testing of technical components". SPIE Vol. 4900.,1299-1309.,2002.

26) Pedrini, G., Alexeenko, I., Gusev, M., Tiziani, H.J., "Vibration measurements of hidden object surfaces by using holographic endoscopes", Proceeding SPIE, Vol. 4827, S. 315-322, 2002.

27) Pedrini, G., Schedin, S., Tiziani, H.J., "Pulsed digital holography combined with laser vibrometry for for 3D measurements of vibrating objects", Optics and Laser in Engineering, Vol. 38, S. 117-129, 2002.

28) Pedrini G.; Tiziani H.J.; Alexeenko,I.," Digital-holographic interferometry with an image- intensifier system Imaging System". Applied Optics-OT 41 ( 2002) 4 pp. 648-653

29) Pedrini, G., Tiziani, H.J., "Short-Coherence Digital Microscopy by Use of a Lensless Holographic Imaging System", Applied Optics-OT, Vol. 41, (22), S. 4489-4496, 2002.

30) Pedrini, G, Tiziani, H.J, Alexeenko, I., "Digital-holographic interferometry with an image- intensifier system", Applied Optics-OT, Vol. 41, No. 4, S. 648-653, Februar 2002.

31) Proll, K.-P., Nivet, J.-M., Voland, Ch., Tiziani, H.J., "Enhancement of the dynamic range of the detected intensity in an optical measurement system by a three-channel technique", Applied Optics, Vol. 41, No. 1, S. 130?135, 2002.

32) Pruss, C., Reichelt, S., Tiziani, H.J., Korolkov, V.P., "Metrological features of diffractive high-efficiency objectives for laser interferometry", Proc. SPIE, Vol. 4900, S. 873-884, 2002.

33) Reichelt, S., Daffner, M., Tiziani, H.J., Freimann, R., "Wavefront aberrations of rotationally symmetric CGHs fabricated by a polar coordinate laser plotter", Journal of Modern Optics, Vol. 49(7), S. 1069-1087, June 2002.

34) Reichelt, S., Pruss, C., Tiziani, H.J., "New design techniques and calibration methods for CGH-null testing of aspheric surfaces", Proc. SPIE, Vol. 4778, S. 158-168, July 2002.

35) Reichelt, S., Pruss, C., Tiziani, H.J., "Specification and characterization of CGHs for interferometrical optical testing", Proc. SPIE, Vol. 4778, S. 206-217, July 2002.

36) Reichelt, S.; Pruss, C.; Tiziani, H. J."Interferometrische Absolutmessung von Asphären" . 103. Jahrestagung der Deutschen Gesellschaft für angewandte Optik (DGaO) Innsbruck, 2002

37) Reichelt, S.; Tiziani, H. J.; Freimann, R. ," Interferometrischer Absoluttest von Fresnelschen Zonenplatten" . 103. Jahrestagung der Deutschen Gesellschaft für angewandte Optik (DGaO) Innsbruck, 2002

38) Rocktäschel, M; Tiziani, H.J. ," Limatations of the Shack-Hartmann sensor for testing optical aspherics" . Optics and Laser Technology 34 (2002) 34 pp. 631-637

39) Ruprecht, A., Wiesendanger, T., Tiziani, H.J., "Signal evaluation for high speed confocal measurements", Applied Optics, Vol. 41, S. 7410-7415, 2002.

40) Tavrov, A., Totzeck, M., Kerwien, N.; Tiziani, H.J., "Rigorous coupled-wave analysis calculus of submicrometer interference pattern and resolving edge position versus signal to noise ratio", Optical Engineering, Vol. 41 (8), S. 1886-1892, 2002.

41) Tavrov, A.; Totzeck, M.; Kerwien, N.; Bohr R.; Tiziani, H.J. ," High-resolution Jones-matrix microscopy by means of interferometry and polarimetry Poster", 103. Jahrestagung der Deutschen Gesellschaft für angewandte Optik (DGaO) Innsbruck , 2002

42) Totzeck, M.; Kerwien, N.; Tavrov, A.; Tiziani, H.J. ," DUV-Mikroskpie: Mehr als nur eine Wellenlängenskalierung" Poster, 103. Jahrestagung der Deutschen Gesellschaft für angewandte Optik (DGaO) Innsbruck , 2002

43) Totzeck, M., Kerwien, N., Tavrov, A., Rosenthal, E, Tiziani, H.J., "Quantitative Zernike phase-contrast microscopy by use of structured birefringent pupil-filters and phase-shift evaluation", Proc. SPIE, Interferometry XI: Techniques and Analysis, Katherine Creath; Joanna Schmit; Eds., Vol. 4777, S. 1-11, 2002.

44) Totzeck, M., Tavrov, A., Kerwien, N., Tiziani, H.J., "Inspection of sub-wavelength structures and zero-order gratings using polarization interferometry", Proc. SPIE, Interferometry XI: Techniques and Analysis, Katherine Creath; Joanna Schmit; Eds., Vol. 4777, S. 330-344, 2002.

45) Wernicke, G.; Krüger, S.; Kallmeyer, F.; Gruber, H.; Osten, W.; Kayser, D.; Demoli, N.," Anwendung von Waveletfiltern in einem optischen Prozessor zur automatischen Fehlererkennung in Interferogrammen". Technisches Messen, 5.,236-239.,2002.

46) Wiesendanger, T., Yasuno, Y., Ruprecht, A., Yatagai, T., Tiziani, H.J. , "Characterization of microoptic arrays by evaluation of the confocal response in axial direction", Technical digest of 3rd. International Conference on Optics-photonics Design & Fabrication (ODF2002), Tokjo 30. Oct – 1. Nov. 2002, S. 75-76, 2002.

47) Wiesendanger, T.; Yasuno, Y.; Ruprecht, A.; Totzeck, M.; Tiziani, H.J. ," Charakterisierung von Mikrooptikarrays durch Auswertung der axialen konfokalen Systemantwort" . 103. Jahrestagung der Deutschen Gesellschaft für angewandte Optik (DGaO) Innsbruck, 2002

48) Windecker, R.; Körner, K.; Fleischer, M..; Tiziani, H.J. ," Signalverarbeitung bei tiefenscannenden 3D-Sensoren für neue industrielle Anwendung" . Technisches Messen 69 (2002) pp. 251-257

49) Yasuno, Y., Yatagai, T., Wiesendanger, T., Ruprecht, A. , Tiziani, H.J., "Aberration measurement from confocal axial intensity response using neural network", Optics Express, 10, S. 1451-1457, 2002.

Publikationen 2001

1) Dalhoff, E., Gärtner, R., Zenner, H.?P., Tiziani, H.J., Gummer, A.W., "Remarks about the depth resolution of heterodyne interferometers in cochlear investigations", Journal of the Acoustical Society of America, Vol. 110, No. 4, S. 1725-1728, Oktober 2001.

2) Falldorf, C.; Osten, W.; Elandaloussi, F.; Kolenovic, E.; Jüptner, W.," Features of the subjective speckle field and their use for noise immune unwrapping". Proc. SPIE Vol 4398 .,pp. 238-247,.2001.

3) Fleischer, M., Windecker, R., Tiziani, H.J., " Theoretical Limits of Scanning White-Light Interferometry Signal Evaluation Algorithms", Applied Optics, Vol. 40, No. 17, S. 2815-2820, 2001.

4) Jüptner; W. Osten," New challenges in remote metrology –shape control using coherent masks". Proc. of the International Balatonfüred Workshop HoloMet 2001. BIAS Verlag, Bremen .,pp. 5-11,.2001.

5) Kalms, M.; Osten, W.; Jüptner, W.," Active industrial surface inspection with the inverse projected-fringe-technique". Proc. SPIE Vol. 4596.,37-47,.2001.

6) Kalms, M.K.; Osten, W.; Jüptner, W.," Inverse projected fringe technique". Proc. SPIE Vol. 4317., pp. 505-510,.2001.

7) Kayser, D., Bothe, Th. ,Osten, W., (Bremer Institut für Angewandte Strahltechnik), Windecker, R., Tiziani, H.J., "Integrated Surface Measurement using the Concept of Scaled Topometry ", Fringe 2001, The 4th International Workshop on Automatic Processing of Fringe Patterns, S. 427-434, 2001.

8) Kayser.D, Th. Bothe, W. Osten, R. Windecker, H. Tiziani," Integrated surface measurement using the concept of scaled metrology". Proc. Fringe 2001, Elsevier Sc.,pp. 427-434,.2001.

9) Kolenovic, E.; S. Lai, W. Osten, W. Jüptner," Endoscopic shape and deformation measurement by means of Digital Holography". Proc. Fringe 2001, Elsevier Sc.,pp. 686-691,.2001.

10) Körner, K.; Droste, U.; Windecker, R.; Fleischer, M.; Tiziani, H.; Bothe, T.; Osten, W.," Projection of structured light in object planes of varying depths for absolute 3D profiling in a triangulation setup". Proc. SPIE Vol 4398.,pp. 23-34,.2001.

11) Körner, K.; U. Droste, R. Windecker, M. Fleischer, H. Tiziani, Th. Bothe, W. Osten," Depth-Scanning fringe projection for absolute 3-D profiling". Proc. Fringe 2001, Elsevier Sc.,pp. 394-401,.2001.

12) Körner, K., Droste, U., Windecker, R., Fleischer, M., Tiziani, H.J., Bothe, Th.a, Osten, W. a, (a Bremer Institut für Angewandte Strahltechnik, Bremen), "Depth-Scanning Fringe Projection for absolute 3-D profiling", Fringe 2001, The 4th International Workshop on Automatic Processing of Fringe Patterns, S. 394-401, 2001.

13) Körner, K., Droste, U., Windecker, R., Fleischer, M., Tiziani, H.J., Bothe, Th.a, Osten, W. a, (a Bremer Institut für Angewandte Strahltechnik, Bremen), "Projection of structured light in object planes of varying depths for absolute 3?D profiling in a triangulation setup", ICEM, Optical Measurement Systems for Industrial Inspection II: Application in Industrial Design, Munich, 18.6.2001, Proceedings SPIE, Vol. 4398, S. 23-34, 2001.

14) Körner, K., Windecker, R., "Absolute macroscopic 3-D measurements with the innovative depth-scanning fringe projection technique (DSFP)", Optik, Vol. 112, No. 9, S. 433-441, 2001.

15) Körner, K., Windecker, R., Fleischer, M., Tiziani, H.J., "One-grating projection for absolute three-dimensional profiling", Optical Engineering, Vol. 40, No. 8, S. 1653-1660, 2001.

16) Krüger, S.; Wernicke, G.; Osten, W.; Kayser, D.; Demoli, N.; Gruber, H.," Fault detection and feature analysis in interferometric fringe patterns by the application of wavelet filters in convolution processors". Journal of Electronic Imaging 10.,1, pp. 228-233,.2001.

17) Krüger, S.; G. Wernicke, W. Osten, D. Kayser, N. Demoli, H. Gruber," The application of wavelet filters in convolution processors for the automatic detection of faults in fringe patterns". Proc. Fringe 2001, Elsevier Sc.,pp. 193-198,.2001.

18) Leonhardt, K., "Ellipso-Height Topometry, EHT: extended topometry of surfaces with locally changing materials", Optik, Vol. 112, No. 9, S. 413-420, 2001.

19) Maass, P.; M. Ende, D. Kayser, W. Osten, G. Teschke," Continuous wavelet methods in signal processing". Proc. Fringe 2001, Elsevier Sc.,pp. 142-153,.2001.

20) Menn.P, E. Kolenovic, W. Osten, W. Jüptner," Influence of depolarization effects in interferometric measurement methods". Proc. SPIE Vol 4398.,pp. 50-60,.2001.

21) Mieth, U.; W. Osten, W. Jüptner," Investigations on the appearance of material faults in holographic interferograms". Proc. Fringe 2001, Elsevier Sc.,pp. 163-172,.2001.

22) Osten, W.; Beumler, K.," Mikrokomponenten brauchen Sensoren zur Bestimmung von Materialparametern". Technisches Messen 68.,2, 55-56,.2001.

23) Osten, W.; Seebacher, S.; Baumbach, Th.; Jüptner, W.," Messtechnische Grundlagen zur Inspektion von Mikrokomponenten mittels Digitaler Holografie". Technisches Messen 68.,2, 68-79,.2001.

24) Osten, W.; Seebacher, S.; Baumbach, Th.; Jüptner, W.," Ein Messsystem zur Bestimmung von Materialkennwerten an Mikrokomponenten auf Basis der Digitalen Holografie". Technisches Messen 68.,2, 80-85,.2001.

25) Osten, W.; Seebacher, S.; Baumbach, Th.; Jüptner, W.," Absolute shape control of microcomponents using Digital Holography and multi-wavelengths-contouring". Proc. SPIE Vol. 4275.,pp. 71-84,.2001.

26) Osten, W.; Seebacher, S.; Jüptner, W.," The application of Digital Holography for the inspection of microcomponents". Proc. SPIE Vol 4400.,, pp.1-15,.2001.

27) Osten, W.; T. Baumbach, S. Seebacher, W. Jüptner," Remote shape control by comparative digital holography". Proc. Fringe 2001, Elsevier Sc.,pp. 373-382,.2001.

28) Osten, W.; Baumbach, T.; Seebacher, S.; Jüptner, W.: Vergleichende Formprüfung mit kohärenten Masken". LaserOpto 33.,4, 62-67,.2001.

29) Osten, W.; Seebacher, S.; Jüptner, W.," The application of Digital Holography for the inspection of microcomponents". Intern. Conf. Laser 2001, Munich June 2001.

30) Osten, W.; Baumbach, T.; Jüptner, W.," A new sensor for remote interferometry". Proc. SPIE Vol. 4596.,158-168,.2001.

31) Osten.W; W. Jüptner," Trends for the solution of identification problems in Holographic Nondestructive Testing". Proc. of the International Balatonfüred Workshop HoloMet 2001. BIAS Verlag, Bremen .,pp. 44-54,.2001.

32) Pedrini, G., Schedin, S., "Short coherence digital holography for 3D microscopy", Optik, Vol. 112, No. 9, S. 427-432, 2001

33) Pedrini, G., Schedin, S., Alexeenko, I., Tiziani, H.J., "Use of endoscopes in pulsed digital holographic interferometry", Proc. SPIE, Vol. 4399, S. 1-8, 2001

34) Pedrini, G., Schedin, S., Tiziani, H.J., "Aberration compensation in digital holographic reconstruction of microscopic objects", Journal of Modern Optics, Vol. 48, Nr. 6, S. 1035-1041, 2001.

35) Pedrini, G., Tiziani, H.J., "Digital holographic interferometry", in: Digital speckle pattern interferometry and related techniques, ed.: P. K. Rastogi, Wiley & Sons, S. 337-362, 2001.

36) Perez,Lopez, C., Mendoza Santoyo, F., Pedrini, G., Schedin, S., Tiziani, H.J., "Pulsed digital holographic interferometry for dynamic measurement of rotating objects with an optical derotator", Applied Optics, Vol. 40, No. 28, S. 5106-5110,Oktober 2001,.

37) Poleshchuk, A.G., Korolkov, V.P., Cherkashin, V.V., Reichelt, S., Burge, J.H., "Polar coordinate laser writing systems: error analysis of fabricated DOEs", Proc. SPIE, Vol. 4440, S. 161-172, 2001.

38) Reichelt, S., Freimann, R. a, Tiziani, H.J., (a Zeiss, Oberkochen), "Absolute interferometric test of Fresnel zone plates", Optics Communications, Vol. 200, 2001, S. 107?117.

39) Schedin, S., Pedrini, G., Tiziani, H.J., Aggarrwal, "Comparative Study of Various Endoscopes for Pulsed Digital Holographic Interferometry", Applied Optics, Vol. 40, Nr. 16, S. 2692-2697, Juni 2001.

40) Schedin, S., Pedrini, G., Tiziani, H.J., Aggarrwal, A.K., Gusev, M., "Highly sensitive pulsed digital holography for build-in defect analysis with a laser excitation", Applied Optics, Vol. 40, Nr. 1, S. 100-103, Januar 2001.

41) Seebacher, S.; Osten, W.; Baumbach, Th.; Jüptner, W.," The Determination of Material Parameters of Microcomponents Using Digital Holography". Opt. Las Eng. 36.,2, 103-126,.2001.

42) Seebacher, S.; Osten, W.; Veiko, V.P.; Voznessenski, N.B.," Inspection of nano-sized SNOM-tips by optical far-field evaluation". Opt. Las Eng. 36.,5, pp- 451-474,.2001.

43) Tiziani, H.J., "Macro- and microscopic surface measurement", Fringe 2001, The 4th International Workshop on Automatic Processing of Fringe Patterns, S. 15-4, 2001.

44) Tiziani, H.J., "Optical 3D-Shape, Surface, and Material Analysis", ICEM, The 2nd International Conference on Experimental Mechanics, Singapore, 30.11.2000, Proceedings SPIE, Vol. 4317, S. 204-210, 2001.

45) Tiziani, H.J., "Progress in temporal speckle modulation", Optik, Vol. 112, No. 9, S. 370-380, 2001.

46) Tiziani, H.J., Haist, T., Liesener, J., Reicherter, M., Seifert, L., "Application of SLMs for optical metrology", Proc. SPIE, Vol. 4457, November 2001, S. 72-81.

47) Tiziani, H.J., Haist, T., Reuter, S. "Optical inspection and characterization of microoptics using confocal microscopy", Optics and Lasers in Engineering, Vol. 36, S. 403-15, November 2001.

48) Tiziani, H.J., Reichelt, S., Pruss, C., Rocktäschel, M., Hofbauer, U., "Testing of aspheric surfaces", Proc. SPIE, Vol. 4440, S. 109-119,2001.

49) Tiziani, H.J., Totzeck, M., "High-Resolution Inspection of Technical Surfaces", HoloMet 2001, International Balatonfüred Workshop "New Perspectives for Optical Metrology", S. 55-58, Juni 2001.

50) Tornari, V.; A. Bonarou, P. Castellini, E. Esposito, W. Osten, M. Kalms, N. Smyrnakis, S. Stasinopulos," Laser based systems for the structural diagnostic of artworks: an application to XVII century Byzantine icons". Proc. SPIE Vol. 4402.,pp. 172-183,.2001.

51) Totzeck, M., "Numerical simulation of high-NA quantitative polarization microscopy and corresponding near-fields", Optik, Vol. 112, No. 9, S. 399-406, 2001.

52) Totzeck, M., Jacobsen, H., Tiziani, H.J., "High-resolution inspection of 2D microstructures using multimode polarization microscopy", Proc. SPIE - Int. Soc. Opt. Eng. (USA), Vol. 4349, S. 109-16, 2001.

53) Windecker, R., "High resolution optical sensor for the inspection of engine cylinder walls", Optik, Vol. 112, No. 9, S. 407-412, 2001.

54) Windecker, R., Fleischer, M., Körner, K., Tiziani, H.J., "Testing micro devices with fringe projection and white-light interferometry", Optics and Lasers in Engineering, Vol. 36, S. 141-154, August 2001.

55) Windecker, R., Körner, K., Tiziani, H.J., "Depth-scanning fringe projection - A new technique for absolute phase evaluation", Proc. SPIE, Vol. 4596, S. 29-36, 2001.

56) Windecker, R., Körner, K., Fleischer, M., Droste, U., Tiziani, H.J., "Generalized Signal Evaluation for White-light interferometry and Scanning fringe projection ", Fringe 2001, The 4th International Workshop on Automatic Processing of Fringe Patterns, S. 173-180, 2001.

Publikationen 2000

1) Beumler, K.; Osten, W.," Optisches 3D-Inspektionssystem zur ortsaufgelösten Materialkennwertermittlung an strukturierten Mikrokomponenten (MikroMak)", F&M, 108.,9, 66-68., 2000.

2) Beumler, K.; Jüptner, W.; Osten, W.: Optisches 3D-Inspektionssystem zur ortsaufgelösten Materialkennwertermittlung an strukturierten Mikrokomponenten (MikroMak), Infobörse Mikrosystemtechnik 1-2000, VDI/VDE Technologiezentrum Informationstechnik GmbH, Teltow 2000.

3) Daffner, M., Reichelt, St., Tiziani, H.J., "Adaptive Optics for Testing Aspheric Surfaces", Proceedings of the 2nd international workshop on "Adaptive optics for industry and medicine", 12-16 July 1999 in Durham, England, editor: Gordon D. Love, World Scientific, S. 141-146, 2000.

4) Daffner, M., Reichelt, St., Tiziani, H.J.,"Adaptive Optics for Testing Aspheric Surfaces", Proceedings of the 2nd international workshop on "Adaptive optics for industry and medicine", 12-16 July 1999 in Durham, England, editor: Gordon D. Love, World Scientific, S. 141-146, 2000.

5) Fleischer, M., Windecker, R., Tiziani, H.J., "Fast algorithms for data reduction in modern optical three-dimensional profile measurement systems with MMX technology", Applied Optics, Vol. 39, No. 8, S. 1290-1297, 2000.

6) Fleischer, M., Windecker, R., Tiziani, H.J., "Fast algorithms for data reduction in modern optical three-dimensional profile measurement systems with MMX technology", Applied Optics, Vol. 39, No. 8, S. 1290-1297, 2000.

7) Haible, P., Kothiyal, M. P., Tiziani, H.J., "Heterodyne temporal speckle-pattern interferometry", Applied Optics, Vol. 39, No. 1, S. 114-117, 1. Jan. 2000.

8) Haible, P., Kothiyal, M. P., Tiziani, H.J., "Heterodyne temporal speckle-pattern interferometry", Applied Optics, Vol. 39, No. 1, S. 114-117, 1. Jan. 2000.

9) Haible, P., Tiziani, H.J., "Einsatzmöglichkeiten moderner Lichtmodulatoren in der Bildverarbeitung", VDI Berichte, 1572, S. 25-30, 2000.

10) Kayser, D.; Osten, W.; Jüptner, W.," A scale independent algorithm for the detection of fault indicating structures in range images". Proc. Int. Conf. „Interferometry in Speckle Light", Lausanne 2000, Springer Verlag Belin, Heidelberg, New York, pp. 389-396., 2000.

11) Kolenovic, E.; Osten, W.; Jüptner, W.," Influence of unresolved speckles in interferometric phase measurements". Proc. SPIE Vol. 4101A, pp. 104-112., 2000.

12) Krüger, S.; Wernicke, G.; Osten, W.; Kayser, D.; Demoli, N.; Gruber, H.," Fault detection and feature analysis in interferometric fringe patterns by the application of wavelet filters in convolution processors". Proc. SPIE Vol. 3966, pp. 145-153., 2000.

13) Liesener, J., Reicherter, M., Haist, T., Tiziani, H.J., "Multi-functional optical tweezers using computer-generated holograms",Optics Communications, Vol. 185, S.25-30,2000.

14) Mendoza Santoyo, F ., Pedrini, G., Fröning, Ph., Tiziani, H.J., Kulla, P.H. ., ., "Comparison of double-pulse digital holography and HPFEM measurements",Optics and Lasers in Engineering, Vol. 32, S. 529-536, 2000.

15) Osten, W.," The Application of Optical Shape Measurement for the Nondestructive Evaluation of Complex Objects". Opt. Eng. 39.,1, 232-243., 2000.

16) Osten, W.; Kayser, D.; Jüptner, W. ," An active approach for high resolution measurement of technical surfaces". Proc. IMEKO 2000, Wien, Vol. II, pp. 255-259., 2000.

17) Osten, W.; Kayser, D.; Bothe, Th.; Jüptner, W.," High resolution measurement of extended technical surfaces with scalable topometry". Proc. SPIE Vol. 4101A, pp. 166-172.,2000.

18) Osten, W.; Kalms, M.; Jüptner, W.; Tober, G.; Bisle, W.; Scherling, D.," A shearography system for the testing of large scale aircraft components taking into account non-cooperative surfaces". Proc. SPIE Vol. 4101B, pp. 432-438., 2000.

19) Osten, W," Holography and Virtual 3D-Testing". In: Proc. International Berlin Workshop HoloMet 2000, New Prospects of Holography and 3D-Metrology. Strahltechnik Vol. 14, 14-17, Bremen 2000

20) Osten, W.; Jüptner, W.," Moderne optische Sensoren zur 3-dimensionalen Form- und Verformungsmessung". LaserOpto Oktober 32.,5, pp. 51-57., 2000.

21) Osten, W.; Kujawinska, M.," Active phase measuring metrology". Intern. Conference: Trends in optical NDT. Lugano May, 2000.

22) Pedrini, G, Schedin S, Tiziani, H. J., "Combination of pulsed digital holography and laser vibrometry for 3D measurements of vibrating objects", Proceedings SPIE, Vol. 4072, S. 294-301, 2000.

23) Pedrini, G, Schedin S, Tiziani, H. J., "Digitale gepulste holographische Interferometrie für dynamische Messungen", LaserOpto, 32 (5), S. 58-61, Oktober 2000.

24) Pedrini, G, Schedin S, Tiziani, H. J., "Spatial filtering in digital holographic microscopy", Journal of Modern Optics, Vol. 47, 8,S. 1447-1454, 2000.

25) Pedrini, G., Tiziani, H.J., Gusev, M.E., "Pulsed digital holographic interferometry with 694- and 347-nm wavelengths", Applied Optics, Vol 39, No. 2, S. 246-249, 2000.

26) Pedrini, G., Tiziani, H.J., Gusev, M.E., "Pulsed digital holographic interferometry with 694- and 347-nm wavelengths",Applied Optics, Vol 39, No. 2, S. 246-249, 2000.

27) Proll, K.-P., Nivet, J.-M., Voland, Ch., Tiziani, H.J., "Application of a liquid-crystal spatial light modulator for brightness adartation in microscopic topometry", Applied Optics, Vol. 39, No. 34, S. 6430-6435, 2000.

28) Rocktäschel, M., Pahlke, M., Tiziani, H.J., "Beam shaping and diagnostic with diffractive optical elements", LaserOpto, 32(4), S, 47-52, August 2000:

29) Schedin, S., Pedrini, G., Tiziani, H.J., "Pulsed digital holography for deformation measurements on biological tissues", Applied Optics, Vol. 39, Nr. 16, S. 2853-2857, Juni 2000.

30) Seebacher, S.; Baumbach, Th.; Osten, W.; Jüptner, W.," Combined measurement of shape and deformation of small objects using digital holographic contouring and holographic interferometry". Proc. Int. Conf. On Trends in Optical Nondestructive Testing, Lugano, pp. 55-65., 2000.

31) Seebacher, S.; Baumbach, Th.; Osten, W.; Jüptner, W.," Combined 3D-shape and deformation analysis of small objects using coherent optical techniques on the basis of digital holography". Proc. SPIE Vol. 4101B, pp. 520-531., 2000.

32) Seebacher, S.; Osten, W.; Jüptner, W.; Veiko, V.P.; Voznessenski, N.B.," Determination of geometric properties of SNOM tips by means of far-field evaluation". Proc. SPIE Vol. 4098A, pp. 110-120., 2000.

33) Siegert, K., Tiziani, H.J., Dogan, N., Wagner, S., Franz, S., Windecker, R., "Oberflächenstrukturen von Feinblechen und Werkzeugen", UTF science, I/2000, S. 23-25, 2000.

34) Siegert, K., Tiziani, H.J., Dogan, N., Wagner, S., Franz, S., Windecker, R., "Oberflächenstrukturen von Feinblechen und Werkzeugen", UTF science, I/2000, S. 23-25, 2000.

35) Tiziani, H.J., "Shape, surface and deformation measurement:scope and trends", Proceedings of IUTAM Symposium on Advanced Optical Methods and Applications in solid Mechanics,31.08.-04.09.1998 in poitiers,France,in :Solid Mechanics and its Applications,Vol. 82, S. 123-136, 2000.

36) Tiziani, H.J., Haist, T., "Surface and defect analysis using spatial light modulators",Proceedings SPIE, Vol. 4113, S. 86-95, 2000.

37) Tiziani, H.J., Wegner, M., Steudle, D., "Confocal principle for macro- and microscopic surface and defect analysis", Optical Engineering, Vol. 39, No. 1, S. 32-39, 2000.

38) Tiziani, H.J., Wegner, M., Steudle, D., "Confocal principle for macro- and microscopic surface and defect analysis", Optical Engineering, Vol. 39, No. 1, S. 32-39, 2000.

39) Totzeck, M., Jacobsen, H., Tiziani, H.J., "Edge localization of sub-wavelength structures using polarization interferometry and extreme-value criteria", Applied Optics, Vol.39, No. 34, S. 6295-6305, 2000.

40) Totzeck, M., Jacobsen, H., Tiziani, H.J., "High-resolution inspection of 2D-microstructures using multi-mode üpolarization microscopy ", GMM-Fachbericht 32:EMC 2000: 17th European Mask Conference, VDE-Verlag, Berlin, S. 121-128, 2000.

41) Totzeck, M., Jacobsen, H., Tiziani, H.J., "High-resolution measurement of 2D-microstructures by means of Jones-matrix microscopy", Proceedings of the 2nd Conference on Design and Fabrication, Japan, S. 309-312, 2000.

42) Vogel, J.; Dost, M.; Seebacher, S.; Fassler, R.; Köpp, N.; Doering, R.; Sommer, J.-P.; Osten, W.; Michel, B.," Modular Loading and Measuring System for Material Characterisation of Microcomponents". Proc. MicroMat Berlin, pp. 690-695., 2000.

43) Wagner, C.; Osten, W.; Seebacher, S.," Direct Shape Measurement by Digital Wavefront Reconstruction and Multi-Wavelength Contouring". Opt. Eng. 39.,1, 79-85., 2000.

Publikationen 1999

1) Elandaloussi, F.; Müller,B.; Osten, W.," Determination of technological parameters in Strip mining by time of flight and image processing". Proc. SPIE Vol. 3824, pp. 346-352. ,1999.

2) Franz, S., Leonhardt, K., Windecker, R., Tiziani, H. J., "Topograph for inspection of engine cylinder walls", Applied Optics, Vol. 38, No. 36, S. 7375-7381, 20. Dezember 1999.

3) Fröning, F., Pedrini, G., Tiziani, H.J., Mendoza Santoyo, F., "Vibration mode separation of transient phenomena using multi-pulse digital holography", Optical Engineering, Vol. 38, No. 12, S. 2062-2068, 1999.

4) Haist, T., Tiziani, H.J., "Iterative nonlinear joint transform correlation for the detection of objects in cluttered scenes", Optics Communications, Vol. 161, S. 310-317, 1999.

5) Haist, T., Wagemann, E.U., Tiziani, H.J., "Pulsed-laser ablation using dynamic computer-generated holograms written into a liquid crystal display", Journal of. Optics A: Pure and Applied Optics, Vol. 1, No. 3, S. 428-430, 1999.

6) Haist, T., Wagemann, E.U., Tiziani, H.J., "Single-frame evaluation of object-adapted fringes", SPIE Proceedings, Vol. 3823, S. 74-83, 9/1999.

7) Hofbauer, U., Dalhoff, E., Tiziani, H.J., "Double-heterodyne-interferometry with delay-lines larger than coherence length of the laser light used", Optics Communications, Vol. 162, No. 1-3, S. 112-120, 1999.

8) Joenathan, C., Haible, P., Tiziani, H.J., "Speckle interferometry with temporal phase evaluation: influence of decorrelation, speckle size, and nonlinearity of the camera", Applied Optics, Vol. 38, No. 7, S. 1169-1178, March 1999.

9) Jüptner, W.; Osten, W.; Kalms, M.," Optical inspection of large Scale Technical Components". Proc. SPIE Vol. 3824, pp. 210-216. ,1999.

10) Kalms, M.; Osten, W.; Jüptner, W.; Bissle, W.; Scherling, D.; Tober, G.," NDT on wide scale aircraft structures with digital speckle shearography". Proc. SPIE Vol. 3824, pp. 280-286. ,1999.

11) Kayser, D.; Osten, W.; Krüger, S.; Wernicke, G.," Application of wavelet filters for feature extraction in interferometric fringe patterns". Proc. SPIE 3744, pp. 270-278. ,1999.

12) Kayser, D.; Osten, W.; Bothe, T.," Fault detection in gray-value images of surfaces on different scales". Proc. SPIE 3744, pp. 110-117. ,1999.

13) Kolenovic, E.; Osten, W.; Jüptner, W.," Non-linear speckle phase changes in the image plane caused by out-of plane displacement". Optics Communications Vol. 171/4-6, pp. 333-344, 1999.

14) Kolenowicz, E.; Osten, W.; Jüptner, W.," Influence of phase singularities on the interferometric measurement of out-of-plane displacements". Proc. SPIE 3744, pp. 174-182. ,1999.

15) Leonhardt, K., Tiziani, H.J., "Optical Topometry with locally changing materials, layers, and contaminations. Part 1 Topographic methods, based on two-beam interferometry", Journal of Modern Optics, Vol. 46, No. 1, S. 101-114, 1999.

16) Merz, T.; Elandaloussi, F.; Osten, W.; Paulus, D.," Active approach for holographic nondestructive testing of satellite fuel tanks". Proc. SPIE Vol. 3824, pp.8-19. ,1999.

17) Osten, W.; Jüptner, W.; Sepold, G.," Some steps forwards to the optical inspection of macro- and microcomponents". In: T. Winkler, and A. Schubert (Eds.), Materials Mechanics - Fracture Mechanics - Micromechanics, Berlin, pp. 140-152, 1999

18) Osten, W.; Jüptner, W.; Seebacher, S.; Baumbach, T.," The qualification of optical measurement techniques for the investigation of material parameters of microcomponents". Proc. SPIE Vol. 3825, pp. 152-164,.1999.

19) Osten, W.; Kalms, M.; Jüptner, W.," Some Ways to Improve the Recognition of Imperfections in Large Scale Components Using Shearography". Proc. SPIE 3745, pp. 244-256. ,1999.

20) Osten, W.; Jüptner, W.," New Light Sources and Sensors for Active Optical 3D-Inspection". Proc. SPIE Vol. 3897, pp. 314-327. ,1999.

21) Osten, W.," Active Vision in Optical Metrology". Euromech 406 Colloquium on Image Processing Methods in Applied Mechanics, Warsaw 6-8 May, 1999.

22) Osten, W.; Hollstein, D.; Jüptner, W.," Industrial Inspection by laser Metrology - The long Way from the Idea to the Running Solution". International Symposium on Laser Metrology for Precision Measurement and Inspection in Industry. Florianopolis/Brasil, Oktober 1999.

23) Osten, W.," New light sources and sensors for optical metrology". ISPA 1999, Singapore, December 1999.

24) Osten, W.; Andrä, P.; Kayser, D.," Hochauflösende Vermessung ausgedehnter Oberflächen mit skalierbarer Topometrie". (Highly-resolved measurement of extended technical surfaces with scalable topometry), Technisches Messen 66.,11, 413-428. ,1999.

25) Osten, W.," Analyse und Modellierung technischer Oberflächen mit kombinativer Lasermesstechnik (Analysis and modeling of technical surfaces using combinative laser metrology)". Technisches Messen 66.,11, 411-412.,1999.

26) Pedrini, G., Fröning, F., Tiziani, H.J., Mendoza Santoyo, F., "Shape measurement of microscopic structures using digital holograms", Optics Communications, Vol. 164, S. 257-268, 1999.

27) Pedrini, G., Fröning, Ph., Tiziani, H.J., Gusev, M.E., "Pulsed digital holography for high-speed contouring that uses a two-wavelength method", Applied Optics, Vol. 38, No. 16, S. 3460-3467, 1999.

28) Pedrini, G., Mendoza Santoyo, F., Schedin, S., Fröning, Ph., Tiziani, H.J., "Whole 3D-digital holographic measurements of vibrating objects", SPIE Proceeding, Vol. 3823, S. 53-63, 1999.

29) Pedrini, G., Schedin, S., Tiziani, H.J., "Lensless digital-holographic interferometry for the measurement of large objects", Optics Communications, Vol. 171, S. 29-36, Nov. 1999.

30) Reicherter, M., Haist. T., Wagemann, E.U., Tiziani, H.J., "Optical particle trapping with computer-generated holograms written on a liquid-crystal display", Optics letters, Vol. 24, No. 9, S. 608-610, 1999.

31) Sainov, V.; Metchkarov, N.; Kostov, V.; Osten, W.," Optical processing of interference patterns". In: Proc. SPIE Vol. 4101A, pp. 249-253. ,1999.

32) Schedin, S., Pedrini, G., Tiziani, H.J., Mendoza Santoyo, F., "All-fibre pulsed digital holography", Optics Communications, Vol. 165, S. 183-188, July 1999.

33) Schedin, S., Pedrini, G., Tiziani, H.J., Mendoza Santoyo, F., "Simultaneous three-dimensional dynamic deformation measurements with pulsed digital holography", Applied Optics, Vol. 38, No. 34, S. 7056-7062, Dez. 1999.

34) Seebacher, S.; Osten, W.; Jüptner, W.; Veiko, V.P.; Vosnessenski, N.B.," Determination og geometric properties of SNOM tips by means of a combined far-field and near-field evaluation". Proc. SPIE Vol. 3740, OICOSN´99, pp. 312-322, 1999

35) Seebacher, S.; Osten, W.; Wagner, Chr.," Combined measurement of shape and deformation of microcomponents by holographic interferometry and multiple wavelength contouring". Proc. SPIE Vol. 3740, OICOSN´99, pp. 58-69, 1999

36) Tiziani, H.J., "Aktuelle Entwicklungen auf dem Gebiet der 3D-Form- und Oberflächenvermessung", Berichtsband 70, DGZfP, GMA, VDI/VDE, Berlin, S. 193-208, 1999.

37) Tiziani, H.J., "Mikrooptik in der Messtechnik", 27. DGaO-Schule, Mikrooptik-Proc., Jena, S. 37-43, 1999.

38) Tiziani, H.J., Joenathan, C., Haible, P., "Heterodyne temporal speckle pattern interferometry", ICO-18, SPIE, Vol. 3749, S. 180-181, 1999.

39) Tiziani, H.J., Pahlke, M., Rocktäschel, M., "Manufacture and Application of Diffractive Elements for Laser-Beam-shaping and Diagnostics", Precision Engineering-Nanotechnology, Proceedings of the 1st international conference, Vol. 2, S. 32-35, 1999.

40) Tiziani, H.J., Windecker, R., Wegner, M., Leonhardt, K., Steudle, D., Fleischer, M., "Messung und Beschreibung von Mikrostrukturen unter Berücksichtigung materialspezifischer Eigenschaften", Technisches Messen, Vol. 66, No. 11, S. 429-436, 1999.

41) Totzeck, M., Jacobsen, H., Tiziani, H.J., "Phase-shifting polarization interferometry for microstructure inspection", SPIE Proceedings, Vol. 3744, S. 75-85, 1999.

42) Totzeck, M., Jacobsen, H., Tiziani, H.J., "Usage of polarization for high-accuracy micrometrology sensors", SPIE Proceedings, Vol. 3897, S. 424-435, 1999.

43) Totzeck, M., Tiziani, H.J.,"Phase-shifting polarization interferometry for microstructure linewith measurement", Optics letters, Vol. 24, No. 5, S. 294-296, 1999.

44) Wagemann, E.U., Haist, T., Schönleber, M., Tiziani, H.J., "Fast shape and position control by Moiré-filtering and object-adapted fringe projection", Optics Communications, Vol. 165, S. 7-10, 1999.

45) Wagner, C.; Seebacher, S.; Osten, W.; Jüptner, W.," Digital Recording and Numerical Reconstruction of Lensless Fourier Holograms in Optical Metrology". Appl. Opt. 3822, 4812-4820.,1999.

46) Windecker, R., Fleischer, M., Tiziani, H.J. "White-light interferometry with an extended zoom range", Journal of Modern Optics, Vol. 46, No. 7, S. 1123-1135, 1999.

47) Windecker, R., Franz, S., Tiziani, H.J., "High-speed optical 3-D roughness measurements", Proceedings for the EUROPTO meeting, Munich (1999), 3824, 1999.

48) Windecker, R., Franz, S., Tiziani, H.J. "Optical roughness measurements with fringe projection", Applied Optics, Vol. 38, No. 13, S. 2837-2842, 1999.

49) Windecker, R., Tiziani, H.J., "Optical roughness measurements using extended white-light interferometry", Optical Engineering, Vol. 38, No. 6, S. 1081-1087, 1999.

50) Zhai, H.C., Tiziani, H.J., Kang, H., Zhu, X.S., Zhang, T.Q., Zhan, Y.L., "Phase modulation of power spectrum in a joint transform correlator for multiple objects with multiple grey levels", Optik, Vol. 110, No. 4, S. 167-171, 1999.

Publikationen 1998

1) Budzinski, Ch., Tiziani, H.J., "Vision ´97 - Internationale Fachmesse für industrielle Bildverarbeitung", Laser und Optoelektronik, Vol. 30, No. 1, 1998.

2) Dalhoff, E., Gärtner, R., Hofbauer, U., Tiziani, H.J., Zenner, H.-P., Gummer, A.W. (Hals-Nasen-Ohren-Klinik, Universität Tübingen), "Low coherence fiber heterodyne interferometer for both DC and high-frequency vibration measurements in the inner ear", Journal of Modern Optics, Vol. 45, No. 4, S. 765-775, 1998.

3) Elandaloussi, F.; Osten, W.; Jüptner; W.," Automatic flaw detection using recognition by synthesis: Practical results". Proc. SPIE Vol. 3479, pp. 228-234., 1998.

4) Franze, B., Tiziani, H.J., "Multiple wavelengths in oblique-incidence interferometer for rough-surface measurement using laser diodes", Journal of Modern Optics, Vol. 45, No. 4, S. 861-872, 1998.

5) Fröning, Ph., Pedrini, G., Fessler, H., Tiziani, H.J., Kulla, P.H., Reinprecht, W., "Modeforms of a rectangular plate: Comparaison of digital holographic measurements and HPFEM-Analysis", in: Vibration Measurements by Laser Techniques: Advances and Applications, E. P. Tommasini Editor, Proceedings of SPIE, Vol. 3411, S. 148-162, 1998.

6) Fröning, Ph., Pedrini, G., Fessler, H., Tiziani, H.J., "Measurement of random and transient deformations of a vibrating plate with multi-pulse digital holography and their decomposition into eigenmodes", in: Vibration Measurements by Laser Techniques: Advances and Applications, E. P. Tommasini Editor, Proceedings of SPIE, Vol. 3411, S. 114-124, 1998.

7) Haist, T., Tiziani, H.J., "Optical detection of random features for high security applications", Optics Communications, Vol. 147 (1. Feb. 1998), No. 1-3, S. 173-179, 1998.

8) Haist, T., Schönleber, M., Tiziani, H.J., "Positioning of noncooperative objects by use of joint transform correlation combined with fringe projection", Applied Optics, Vol. 37, No. 32, S. 7553-7559, 1998.

9) Joenathan, C., Franze, B., Haible, P., Tiziani, H.J., "Shape measurements by use of temporal Fourier-transform in dual beam illumination speckle interferometry", Applied Optics, Vol. 37, No. 16, S. 3385-3390, 1998.

10) Joenathan, C., Franze, B., Haible, P., Tiziani, H.J., "Speckle interferometry with temporal phase evaluation for measuring large object deformation", Applied Optics, Vol. 37, No. 13, S. 2608-2614, 1998.

11) Joenathan, C., Franze, B., Haible, P., Tiziani, H.J., "Large in-plane displacement measurement in dual-beam speckle interferometry using temporal phase measurement", Journal of Modern Optics, Vol. 45, No. 9, S. 1975-1984, September 1998.

12) Joenathan, C., Franze, B., Haible, P., Tiziani, H.J., "Novel temporal Fourier transform speckle pattern shearing interferometer", Optical Engineering, Vol. 37, No. 6, S. 1790-1795, June 1998.

13) Jordan, H.-J., Wegner, M., Tiziani, H.J., "Highly accurate non-contact characterisation of engineering surfaces using confocal microscopy", Journal of Measurement Science and Technology (MST) - Special Issue on Dimensional Metrology 9, S. 1142-1151, 1998.

14) Jüptner, W.; Osten, W.; Seebacher, S.," 3D-displacement measurement of micro-components using digital holography". In: Topics on Nondestructive Evaluation. Vol. 3, pp. 357-363.,1998.

15) Jüptner, W.; Kujawinska, M.; Osten, W.; Salbut, S.; Seebacher, S.," Combined Measurement of Silicon Microbeams by Grating Interferometry and Digital Holography". Proc. SPIE Vol. 3407, pp. 348-357., 1998.

16) Kalms, M.; Osten, W.; Jüptner, W.," Inverse projected fringe technique with automatic pattern adaption using a programmable spatial light modulator". Proc. SPIE Vol. 3407, pp. 483-489 ,.1998.

17) Kujawinska, M.; Osten, W.," Fringe pattern analysis methods: Up-to-date review". Proc. SPIE Vol. 3407, pp. 56-66,.1998.

18) Leonhardt, K., Droste, U., Tiziani, H.J., "Topometry for locally changing materials", Optics Letters, Vol. 23, No. 22, S. 1772-1774, 1998.

19) Osten, W.," Active optical metrology - a definition by examples". Proc. SPIE Vol. 3478, pp. 11-25,. 1998.

20) Osten, W.; Jüptner, W.; Seebacher, S.," The qualification of large scale approved measurement techniques for the testing of microcomponents". Proc. 18th Symposium on Experimental Mechanicsof Solids, Jachranka, pp. 43-55., 1998.

21) Osten, W.; Elandaloussi; F.; Mieth, U.," Software brings automation to fringe-pattern processing. EuroPhotonics". pp 34-35., February/March 1998.

22) Osten, W.," Optische Messtechniken zur Form- und Verformungsmessung für industrielle Anwendungen". Proc. Workshop „Optische Messtechnik in der industriellen Fertigung", Bremen, S. 19-44., 24. September 1998.

23) Osten, W.; Jüptner, W.; Seebacher, S.," The qualification of large scale approved measurement techniques for testing of microcomponents". XVIII Polish Symposium on Experimental Mechanics of Solids, Jachranka, October 14-18.1998

24) Pedrini G., Fröning Ph., Fessler H., Tiziani H. J., "In-line digital-holographic interferometry", Applied Optics, Vol. 37, No. 26, S. 6262-6269, 1998.

25) Schönleber, M., Wagemann, E.U., Tiziani, H.J., "Shape deviation measurement with enhanced depth using adapted fringe projection and multiple exposed holograms", 31st ISATA Proceedings, 2.-5. June 1998, Advanced Manufactoring / Innovation Management, Düsseldorf, S. 71-84, June 1998.

26) Seebacher, S.; Osten, W.; Jüptner, W.," Measuring shape and deformation of small objects using digital holography". Proc. SPIE Vol. 3479, pp. 104-115,. 1998.

27) Singer, W., Tiziani, H.J., "Born approximation for the nonparaxial scalar treatment of thick phase gratings", Applied Optics, Vol. 37, No. 7, S. 1249-1255, 1998.

28) Tiziani, H.J., (invited), "Surface topometry by multi-wavelength technique and temporal Fourier transformation", International Conference on Applied Optical Metrology, Balatonfüred, Hungary, 8-11 June 1998, Proceedings of SPIE Vol. 3407, 1998.

29) Tiziani, H.J., (invited), Vortragender: Kothiyal, M.P., "Spectral and temporal phase evaluation for interferometry and speckle applications", International Conference on Optics and Optoelectronics (ICOL), Dehra Dun, India, December 9-12, 1998.

30) Tiziani, H.J., "Image analysis for Micro- and Macrostructure Measurement", Informatik aktuell, Mustererkennung 1998, hrsg. P. Levi, M. Schanz, R.J. Ahlers, F. May, Springer Verlag Berlin, Heidelberg, New York, S. 23-36, 1998.

31) Tiziani, H.J., "Oberflächenvermessung und Defekterkennung Surface inspection and defect analysis", Laser und Optoelektronik, Vol. 30, No. 2, S. 58-65, 1998.

32) Tiziani, H.J., "Shape, surface and deformation measurement: scope and trends", IUTAM Symposium, TH- GL11, Tome , 1998.

33) Tiziani, H.J., Franze, B., Haible, P., Joenathan, C., "Surface topometry by multi-wavelength techniques and temporal Fourier transformation", SPIE Proc. Int. conference on applied optical metrology, Hungary, Vol. 3407, S. 96-104, 1998.

34) Tiziani, H.J., Pedrini, G., Fröning, Ph., "Pulsed digital holography for vibration analysis", Proceedings of SPIE, Vol. 3407, S. 210-217, 1998.

35) Tornari, V.; Zafiropulos, V.; Vainos, N.A.; Osten, W.; Elandaloussi, F.," A holographic systematic approach to alleviate major dilemmas in museum operation". Proc. EVA´98, Berlin, pp. V51-V59., 1998

36) Wagemann, E.U., Haist, T., Tiziani, H.J., "Defect enhancement using Fresnel imaging and TN-LCD", Optics Communications, Vol. 156, No. 4-6, S. 231-234, 1998.

37) Wagemann, E.U., Tiziani, H.J., "Echtzeit-Defekterkennung in Videobildern", Technisches Messen, Vol. 65, No. 7/8, S. 280-287, 1998.

38) Wagemann, E.U., Tiziani, H.J., "Real time defect detection in video images", OPTO 98, 18.-20. May 1998, Erfurt, OPTO ´98 Proceedings, S. 167-172, 1998.

39) Wagemann, E.U., Tiziani, H.J., "Spatial self-filtering using photorefractive and liquid crystals", Journal of Modern Optics, Vol. 45, No. 9, S. 1885-1897, 1998.

40) Wagemann, E.U., Schönleber, M., Tiziani, H.J., "Grazing holographic projection of object-adapted fringes for shape measurements with enhanced sensitivity", Optics Letters, Vol. 23, No. 20, Oct, 15, S. 1621-1623, 1998.

41) Windecker, R., Fleischer, M., Tiziani, H.J., "Low-coherence fiber-optic sensor with a large numerical aperture for topographic measurements", Applied Optics, Vol. 37, No. 19, S. 4080-4083, July 1998.

Publikationen 1997

1) Andrä, P.; Jüptner, W.; Kebbel, V.; Osten, W.," General approach for the description of optical 3-D measuring systems". Proc. SPIE Vol. 3174, pp. 207-216 1997.

2) Andrä, P.; Ivanov, E.; Osten, W.," Scaled Topometry - An Active Measurement Approach for Wide Scale 3D Surface Inspection". Proc. Fringe´97. Akademie Verlag Berlin, Berlin, S. 179-189., 1997.

3) Haist, T., Schönleber, M., Tiziani, H.J., "Computergenerated holograms from 3D-Objects written on twisted-nematic liquid crystals displays", Optics Communications 1/97, Vol. 140, No. 4-6, S. 299-308, 1997.

4) Haist, T., Tiziani, H.J., "Fast positioning of non-cooperative objects", EUROPTO 97, Munich Juni 1997, Proceedings of the SPIE, Vol. 3098, S. 424-429, 1997.

5) Haupt, C., Pahlke, M., Budzinski, C., Tiziani, H.J., Krupka, R., "Computergenerierte Hologramme in Silizium und Kupfer für die Materialbearbeitung mit CO2-Hochleistungslasern", Laser und Optoelektronik, Vol. 29, No. 1, S. 48-55, 1997.

6) Haupt, Ch., Pahlke, M., Krupka, R., Tiziani, H.J., "Computer generated microcooled reflection holograms in silicon for material processing with a CO2 laser", Applied Optics, Vol. 36, No. 19, S. 4411-4418, 1997.

7) Hessler, T., Rossi, M., Pedersen, J., Gale, M.T. (Paul Scherrer Institut, Zürich), Wegner, M., Steudle, D., Tiziani, H.J., "Microlens arrays with spatial variation of the optical functions", Pure & Applied Optics, Vol. 6, No. 6, S. 673-681, 1997.

8) Jordan, H.-J., Wegner, M., Tiziani, H.J., "Using Optical Topometry for Roughness Measurement and Form Analysis of Engineering Surfaces Confocal Microscopy", Progress in Precision Engineering and Nanotechnology, Proceedings of the 9th International Precision Engineering Seminar, 4th International Conference on Ultraprecision in Manufacturing Engineering, 26-30 May 1997, Braunschweig, Germany, S. 171-174, 1997.

9) Jüptner, W.; Seebacher, S.; Osten ,W.," Digital holography as a versatile tool for the investigation of the material behaviour of micro components". Proc. ATEM´97, Wakayama/Japan, pp. 415-418., 1997.

10) Jüptner, W.; Osten, W.; Seebacher, S.," Measurement of materials behaviour in microstructures by means of digital holography". In: Geiger, M.; Vollertsen, F. (Eds.): Proc. Lane´97, Laser Assisted Net Shaping Engineering 2. Meisenbach-Verlag Bamberg, pp. 277-285., 1997.

11) Jüptner, W.; Osten, W.," Sensorprinzip zur integrierten Hell-/Dunkelfeldmessung für die optische Qualitätskontrolle". DIN-Fachbericht 65, Mikrosystemtechnik, Beuth Verlag, Berlin, Wien, Zürich, S. 50-57., 1997.

12) Jüptner, W.; Osten, W.; Falldorf, H.; Holm, D.; Grubert, B.; Saedler, J.; Eichhorn, N.; Bieber, E.," Mikrosensor zur integrierten Hell- und Dunkelfeldmessung". Abschlussbericht BMBF Verbundprojekt IMEO, Reihe: Innovation in der Mikrosystemtechnik, Band 52, Teltow 1997

13) Kalms, M.; Jüptner, W.; Osten, W.," Automatic adaption of projected fringe patterns using a programmable LCD-projector". Proc. SPIE Vol. 3100, 156-165 1997.

14) Kalms, M.K.; Jüptner, W.; Osten, W.," Projected-Fringe-Technique with Automatic Pattern Adaption Using a Programmable LCD-Projector". Proc. Fringe´97. Akademie Verlag Berlin, Berlin, S. 231-233., 1997

15) Osten, W.; Elandaloussi, F.; Mieth, U.," The BIAS FRINGE PROCESSOR? - A Useful Tool for the AutomaticProcessing of Fringe Patterns in Optical Metrology". Proc. Fringe´97. Akademie Verlag Berlin, Berlin, S. 98-106., 1997.

16) Osten, W.," Laser in der Messtechnik und Qualitätskontrolle. Reihe Strahltechnik", Band 10, Bremen: BIAS Verlag, S. 235-254.,1997.

17) Osten, W.; Tiziani, H.," Grundlagenuntersuchungen zur Analyse und Modellierung technischer Oberflächen mit kombinativer Lasermesstechnik". In: VDI TZ Physikalische Technologien (Hrg.): Proc. „Laseroptische Mess und Prüfverfahren für die Produktion und Umweltmesstechnik", München, S. 51-78., 18. u. 19. Juni 1997.

18) Osten, W. (Ed.)," Optisches 3D-Inspektionssystem zur ortsaufgelösten Materialkennwertermittlung an strukturierten Mikrokomponenten". Proc. Internationales Statusseminar MikroMak, Bremen 1997

19) Osten, W.," Interferometrische Messtechniken für die experimentelle Festkörpermechanik". (Interferometric measurement technics for solid state mechanics.) GAMM 97. Annual Meeting, Regensburg March 24-27, 1997.

20) Pedrini, G., Fröning, Ph., Fessler, H., Tiziani, H.J., "Transient vibration measurements using multi-pulse digital-holography", Optics & Laser Technology, Vol. 29, No. 8, S. 505-511, 1997.

21) Pedrini, G., Zou, Y., Tiziani, H.J., "Quantitative evaluation of two dimensional dynamical deformations using digital-holography", Optics & Laser Technology, Vol. 29, No. 5, S. 249-256, 1997.

22) Pedrini, G., Zou, Y., Tiziani, H.J., "Digital double-pulse TV-Holography", Optics and Laser in Engineering, Vol. 26, No. 2-3, S. 199-219, 1997.

23) Pedrini, G., Zou, Y., Tiziani, H.J., "Simultaneous quantitative evaluation of in-plane and out-of-plane deformations using multidirectional spatial carrier", Applied Optics, Vol. 36, No. 4, S. 786-792, 1997.

24) Schönleber, M., Tiziani, H.J., "Fast and flexible shape control with adaptive LCD fringe masks", Conference on Optical Inspection and micromeasurent 2, Proc. SPIE, Vol. 3098, S. 35-42, 1997.

25) Seebacher, S.; Osten, W.; Jüptner, W.," Measuring shape, deformation and vibration of micro components using digital holography". Proc. Micro Mat Berlin, pp 230-234., 1997.

26) Seebacher, S.; Osten, W.; Jüptner, W.," 3-D deformation analysis of micro-components using digital holography". Proc. SPIE Vol. 3098, pp.382-391.,1997.

27) Tiziani, H.J., "Heterodynverfahren für hochgenaue Vermessungen im Nahbereich", Abschussbericht des Sonderforschungbereichs 228 - Hochgenaue Navigation , S. 211-234, 1997.

28) Tiziani, H.J., "Optical Metrology of Engineering Surfaces - Scope and Trends", in: Optical Measurement Techniques and Applications, Editor: Rastogi, P.K., ISBN 0-89006-516-0, S. 15-50, 1997.

29) Tiziani, H.J., Achi, R., Jordan, H.J., "Precise, Split Second, and Three-dimensional. The Practical Applications of Confocal Microscopy", German research 2-3/97, S. 22-24, 1997.

30) Tiziani, H.J., Achi, R., Krämer, R.N., Hessler, T., Gale, M.T., Rossi, M., Kunz, R.E. (Paul Scherer Institut, Zürich), "Microlens arrays for confocal microscopy", Optics & Laser Technology, Vol. 29, No. 2, S. 85-91, 1997.

31) Tiziani, H.J., Budzinski, Ch., Rocktäschel, M., "Strahlformung und -diagnose für CO2-Laser mit diffraktiven Optiken", S. 89-97, 1997.

32) Tiziani, H.J., Chen, J.H., "Shack-Hartmann sensor for fast infrared wave-front testing", Journal f Modern Optics, Vol. 44, No. 3, S. 535-541, 1997.

33) Tiziani, H.J., Franze, B., Haible, P., "Wavelength-shift speckle interferometry for absolute profilometry using a mode-hop free external cavity diode laser", Journal of Modern Optics, Vol. 44, No. 8, S. 1485-1496, 1997.

34) Tiziani, H.J., Schönleber, M., Haist, T., "Adaptive Micro- and Macro 3D-Measurement", in: "Optical 3D-Measuring Techniques IV", Wichmann Verlag, S. 125-133, 1997.

35) Totzeck, M., Tiziani, H.J.,"Phase-Singularities in Optical Metrology", PTB-Bericht F30, S. 90-97, 1997.

36) Totzeck, M., Tiziani, H.J.,"Phase-singularities in 2D diffraction-fields and interference-microscopy", Optics Communications, Vol. 138, No. 4-6, S. 365-382, 1997.

37) Totzeck, M., Tiziani, H.J.,"Interference-microscopy of sub-l structures: A rigorous computation method and measurements", Optics Communications, Vol. 136, No. 1-2, S. 61-74, 1997.

38) Wagemann, E.U., Tiziani, H.J., "A comparision of spatial self-filtering using numerical, photorefractive and non-photorefractive techniques", Conference on Optical Inspection and micromeasurent 2, Proc. SPIE, Vol. 3098, EUROPTO 1997, München, June, S. 261-270, 1997.

39) Windecker, R., Fleischer, M., Tiziani, H.J., "Three-dimensional topometry with stereo microscopes", Optical Engineering, Vol. 36, No. 12, S. 3372-3377, 1997.

40) Windecker, R., Tiziani, H.J., "Three-dimensional topometry with a zoom stereo microscope", Proceedings of the 2nd Seminar on Quantitative Microscopy: Geometrical measurements in the micro- and nanometre range with far and near field methods, 6./ 7. November 1997, Wien, in: PTB-Bericht (PTB-F-30), S. 98-105, 1997.

41) Windecker, R., Fleischer, M., Franze, B., Tiziani, H.J., "Two methods for fast coherence tomography and topometry", Journal of Modern Optics, Vol. 44, No. 5, S. 967-977, 1997.

Publikationen 1996

1) Andrä, P.; Jüptner, W.; Nadeborn, W.; Osten, W.; Beeck, M.-A.," 3D-Verschiebungsmessungen an komplexen 3D-Objekten". Proc. Laser´95 , Springer Verlag, Berlin, S. 557-566 1996.

2) Andrä, P.; Beeck, A.; Jüptner, W.; Nadeborn, W.; Osten, W.," Combination of optically measured coordinates and displacements for quantitative investigation of complex objects". Proc. SPIE Vol. 2782., pp.200-210.,1996.

3) Budzinski, Ch., Giesen, A., Haupt, Ch., Hembd-Söllner, Ch., Hügel, H., Huonker, M., Krupka, R., Pahlke, M., Tiziani, H.J., "Strahlungsfeste diffraktive Elemente zur Strahlformung und Strahldiagnose", in: Hochdynamische Strahlführungs- und Strahlformungseinrichtungen für die räumliche Bearbeitung mit Laserstrahlen - Berichte des Industriekolloquiums SFB 349, 4. Juli 1996, Hrsg: Geschäftsstelle des SFB 349, 1996.

4) Budzinski, Ch., Tiziani, H.J., "Strahlungsfeste diffraktive optische Elemente für CO2-Hochleistungslaser", in: Laser in Forschung und Technik Vorträge des 12. internationalen Kongresses Laser '95, Springer-Verlag, Berlin, Heidelberg, S. 915-918, 1996.

5) Budzinski, Ch., Tiziani, H.J., "Stuttgarter Optik-Kolloquium 1996: Stand und Perspektiven der optischen Miniaturisierung, Mikrooptik und Messtechnik", Laser und Optoelektronik, Vol. 28, No. 3, S. 36-37, 1996.

6) Chen, J.H., Kothiyal, M.P., Tiziani, H.J., "Collimation testing of a CO2 laser beam with a shearing interferometer", Optics & Laser Technology, Vol. 28, No. 3, S. 179-181, 1996.

7) Elandaloussi, F.; Mieth, U.; Osten, W.," PC-basierte Rekonstruktion von Phasen-verteilungen mit automatischer konsistenter Markierung von Interferenzstreifen-Skeletten". Proc. Laser´95, Springer Verlag, Berlin, S. 645-648 ,1996.

8) Fischer, E., Dalhoff, E., Tiziani, H.J., "Overcoming coherence length limitation in two wavelength interferometry - an experimental veritication", Optics Communications, Vol. 123, S. 465-472, 1 February 1996.

9) Gärtner, H., Lehle, P., Tiziani, H.J., "Topografieerfassung mit der 3D-Laserkamera", in: Warnecke, H.-J. (Hrsg.), Die Montage im flexiblen Produktionsbetrieb, Berlin, Heidelberg, Springer Verlag, S. 291-302, 1996.

10) Gärtner, H., Lehle, P., Voland, Ch., Tiziani, H.J., "Structured light measurements by double-scan technique", Proc. SPIE Vision Systems: Sensors, Sensor Systems and Components, Besançon (Frankreich), Vol. 2784, S. 21-30, 1996.

11) Hembd-Söllner, Ch., Budzinski, Ch., Tiziani, H.J., "Binary diffractive elements for CO2 laser-beam diagnostics", Proc. PIE, Vol. 2775, S. 549-56, 1996.

12) Hembd-Söllner, Ch., Budzinski, Ch., Tiziani, H.J., "Binary Gratings for CO2 laser-beam diagnostics", Applied Optics, Vol. 35, S. 3662-3670, 1996.

13) Jüptner, W.; Osten, W.; Andrä, P.; Nadeborn, W.," Nondestructive quantitative 3D characterization of a car brake". Proc. SPIE Vol. 2861, 170-179 ,.1996.

14) Jüptner, W.; Osten, W.," 3D-Topography and Deformation". Proc. 17. Symp. Mechaniki Eksperimentalnej, Jachranka 17.-19. pp.277-289., Oktober 1996.

15) Lehle, P., Gärtner, H., Voland, Ch., Tiziani, H.J., "Coded light setups with optimised transformations of code indices", Proc. SPIE Vision Systems: Sensors, Sensor Systems and Components, Besançon (Frankreich), Vol. 2784, S. 12-20, 1996.

16) Lehle, P., Tiziani, H.J., "Oberflächendefekterkennung durch dynamische Beleuchtung", in: Warnecke, H.-J. (Hrsg.), Die Montage im flexiblen Produktionsbetrieb, Berlin, Heidelberg, Springer Verlag, S. 303-312, 1996.

17) Mieth, U.; Osten, W.; Jüptner, W.," Numerical investigations on the appearance of material flaws in holographic interference patterns. Proc. International Symposium on Laser Application in Precision Measurement, Balatonfüred 1996, Akademie Verlag Berlin, 218-225., 1996.

18) Nadeborn, W.; Osten, W.; Andrä, P.," A robust procedure for absolute phase measurement". Opt. & Lasers in Eng. 24245-260., 1996.

19) Osten, W.; Jüptner, W.," Measurement of displacement vector fields of extended objects". Opt. & Lasers in Eng. 24, 261-285, 1996.

20) Osten, W.; Elandaloussi, F., Jüptner, W.," Recognition by synthesis - a new approach for the recognition of material faults in HNDE". Proc. SPIE Vol. 2861.,220-224,.1996.

21) Osten, W.; Nadeborn, W.; Andrä, P.: General hierarchical approach in absolute phase measurement". Proc. SPIE Vol. 2860, 2-13,.1996.

22) Osten, W.," Holografische Interferometrie - Neue Möglichkeiten zur dreidimensionalen Form- und Verformungsmessung". (Holographic interferometry - New possibilities for 3-dimensional shape and displacement measurement.) Proc. GESA´96, GMA-Bericht 29, S. 193-209.,1996.

23) Osten, W.; Nadeborn, W.; Andrä, P.," General hierarchical approach in absolute phase measurement". In: M. Kujawinska, R. Pryputniewicz, M. Takeda (Eds.): Proc. Laser Interferometry VIII: Techniques and Analysis, SPIE Vol. 2860 .,2-13 .,1996.

24) Osten, W.," Holografische Interferometrie - Neue Möglichkeiten zur dreidimensionalen Form- und Verformungsmessung". (Holographic interferometry - New possibilities for 3-dimensional shape and displacement measurement.) Proc. GESA´96, GMA-Bericht 29.,S. 193-209 1996.

25) Pahlke, M., Haupt, C., Niessen, L., Tiziani, H.J., "Diffractive optics for CO2 Laser up to 5 kW", in: Laser in Forschung und Technik Vorträge des 12. internationalen Kongresses Laser '95, Springer-Verlag, Berlin Heidelberg, S. 919-922, 1996.

26) Pedrini, G., Tiziani, H.J.,"Speckle- and digital ho lografic interferometry (a comparision)", in: Proceeding of the 12. International Congress LASER ´95, W. Waidelich (Ed.), Springer-Verlag Berlin, S. 485-488, 1996.

27) Pedrini, G., Zou, Y., Tiziani, H.J., "Quantitative evaluation of digital shearing interferogram using the spatial carrier method", Pure and Applied Optics, Vol. 5, No. 3, S. 313-321, 5 / 1996.

28) Pedrini, G., Zou, Y., Tiziani, H.J., "Speckle size of digitally reconstructed wavefronts of diffusely scattering objects", Journal of Modern Optics, Vol. 43, No. 2, S. 395-407, 1996.

29) Samuels, U., Kreitlow, H., Wright, S.C., Budzinski, Ch., Tiziani, H.J., "Precise wavelength tuning of a dye laser using an active diffractive optical element", Optics & Laser Technology, Vol. 28, No. 6, S. 423-429, 1996.

30) Tiziani, H.J., "Visuelle Prüfverfahren", Spektrum der Wissenschaft, 11 / 1996, S. 108-111, 1996.

31) Tiziani, H.J., "Optische Rauheitsmessung", Proc. Graduiertenkolleg Braunschweig (UNI/PTB), 1996.

32) Tiziani, H.J., Achi, R., Jordan, H.-J., "Hochgenau, sekundenschnell und dreidimensional. Die Möglichkeiten der konfokalen Mikroskopie", forschung - Mitteilungen der DFG 4/96, S. 8-10, 1996.

33) Tiziani, H.J., Achi, R., Krämer, R.N., "Chromatic confocal microscopy with microlenses", Journal of Modern Optics, Vol. 43, No. 1, S. 155-163, 1996.

34) Tiziani, H.J., Achi, R., Krämer, R.N., Wiegers, L., "Theoretical analysis of confocal microscopy with microlenses.", Applied Optics, Vol. 35, No. 1, S. 120-125, 1996.

35) Tiziani, H.J., Maier, N., Rothe, A., "Scanning differential-heterodyne-interferometer with acousto-optic deflectors", Optics Communications, Vol. 123, No. 1-3, 15. Jan. 1996, S. 34-40, 1996.

36) Tiziani, H.J., Pedrini, G.,"Digital holografic interferometry for shape and vibration analysis", SPIE Proc., Vol. 2921, S. 282-287, Singapore, 4.-6. Dezember 1996.

37) Tiziani, H.J., Pedrini, G.,"Digital double pulse-holografic interferometry for vibration analysis", "Shock and Vibration", Vol. 3, No. 2, S. 117-125, 1996.

38) Tiziani, H.J., Rothe, A., Maier, N., "Dual-wavelength heterodyne differential interferometer for high-precision measurements of reflective aspherical surfaces and step heights", Applied Optics, Vol. 35, No. 19, S. 3525-3533, 7 / 1996.

39) Tiziani, H.J., Wieland, P.,"Anforderungen an Sensoren zur Qualitätssicherung und 3-D-Erfassung in der Montage", in: Warnecke, H.-J. (Hrsg.), Die Montage im flexiblen Produktionsbetrieb, Berlin, Heidelberg, Springer Verlag, S. 278-290, 1996.

40) Voland, Ch., Gärtner, H., Lehle, P., Tiziani, H.J., "Aktive Exploration mit adaptiver 3D-Sensorik", ergänzte und korrigierte Version von Manuskript und Vortrag zum 2. ABW-Workshop 3D-BV am 25./26. Januar 1996 an der Technischen Akademie Esslingen in Ostfildern-Nellingen, 1996.

41) Wieland, P., Tiziani, H.J.,"Lasertriangulation in der Qualitätssicherung", in: Warnecke, H.-J. (Hrsg.), Die Montage im flexiblen Produktionsbetrieb, Berlin, Heidelberg, Springer Verlag, S. 313 ff, 1996.

42) Windecker, R., Tiziani, H.J., "Topometrie mittels schneller Datenaufnahme", in: "Laser in Forschung und Technik", Editor: W. Waidelich et al., Springer Verlag Heidelberg, S. 543-546, 1996.

43) Yu, Q.; Andresen, K.; Osten, W.; Jüptner, W.," Noise free normalized fringe patterns and local pixel transforms for strain extraction". Appl. Opt. 35-20, 3783-3790., 1996.

45) Zou, Y., Pedrini, G., Tiziani, H.J., "Surface contouring in a video frame by changing the wavelength of a diode laser", Optical Engineering, Vol. 35, No. 4, S. 1074-1079, 1996.

46) Zou, Y., Pedrini, G., Tiziani, H.J., "Two-wavelength contouring with a pulsed ruby laser by employing TV-holography", Journal of Modern Optics, Vol. 43, No. 3, S. 639-646, 1996.

Publikationen 1995

1) Andrä, P.; Nadeborn, W.; Osten, W.," Grundlagenuntersuchungen zur 3D-Konturerfassung für die experimentelle Spannungsanalyse". In: Laserforschung & Lasertechnik: Holografisch-interferometrische Messtechnik. VDI Technologiezentrum Physikalische Technologien, S. 185-103 1995.

2) Colin, A.; Osten, W.," Automatic Support for Consistent Labeling of Skeletonized Fringe Patterns". J. Mod. Opt. 425, 945-954 ,1995.

3) Budzinski, Ch., Tiziani, H.J., "Strahlungsfeste diffraktive Optiken durch mikrogalvanische Abformung", Laser und Optoelektronik, Vol. 27, No. 1, S. 54-61, 1995.

4) Fischer, E., Dalhoff, E., Heim, S., Tiziani, H.J., "High precision absolute interferometry up to 100 m", in: High Precision Navigation 95, Linkwitz/Hangleiter (Eds.), Dümmeler, Bonn, S. 530-538, 1995.

5) Fischer, E., Dalhoff, E., Hofbauer, U., Tiziani, H.J., "Absolute interferometric distance measurement using a FM-demodulation technique", Applied Optics, Vol. 34, No. 25, S. 5589-5594, 1995.

6) Fischer, E., Link, R., Dalhoff, E., Heim, S., Tiziani, H.J., Gummer, A.W., Zenner, H.P., "Infrared Fiber Interferometer for Microvibration Measurements in the Inner Ear", in: Proceedings of the International Conference "Laser and Optical Technology in Otolarynology", SPIE Vol. 2395, S. 248-257, 1995.

7) Gärtner, H., Lehle, P., Tiziani, H.J., "Dynamische on-line 3D-Konturerfassungen", Broschüre zur Abschlusspräsentation des vom BMBF geförderten Verbundprojektes "3D-Objektvermessungen auf kleinere Entfernungen", S. 73-84, VDI Technologiezentrum Physikalische Technologien, Düsseldorf, 1995.

8) Gärtner, H., Lehle, P., Tiziani, H.J., "New, highly efficient, binary codes for structured light methods", Proc. SPIE Three-Dimensional and Unconventional Imaging for Industrial Inspection and Metrology, Philadelphia (USA), Vol. 2599, S. 4-13, 1995.

9) Haupt, C., Kolodziejczyk, A., Tiziani, H.J., "Resolution and intensity distribution of output images reconstructed by sampled computer-generated holograms", Applied Optics, 10. Juni 1995, Vol. 34., No. 17, S. 3077-3086, 1995.

10) Lehle, P., Gärtner, H., Tiziani, H.J., "Oberflächendefekterkennung durch dynamische Beleuchtung", F&M, Feinwerktechnik, Mikrotechnik, Messtechnik, Vol. 103, No. 6, S. 348-352, Carl-Hanser-Verlag München, 1995.

11) Pedrini, G., Tiziani, H.J.,"Digital double pulse-holographic interferometry using Fresnel and image plane holograms", Measurement, Vol. 15, No. 4, S. 251-260, 1995.

12) Osten, W.; Andrä, P.; Nadeborn, W.; Jüptner, W.," Modern approaches for absolute phase measurement". Proc. SPIE Vol. 2647, 529-540 ,1995.

13) Osten, W.; Andrä, P.; Nadeborn, W.; Jüptner, W.," Modern approaches for absolute phase measurement". In: O.V. Angelsky (Ed.): International Conference on Holography and Correlation Optics. Chernovtsy 15-19 May, 1995, Proc. SPIE Vol. 2647, 529-540 1995.

14) Pedrini, G., Zou, Y., Tiziani, H.J., "Comparision of two reflecting surfaces by digital holografic interferometry", Optics Communications, Vol. 118, No. 3-4, S. 186-192, 1995.

15) Pedrini, G., Zou, Y., Tiziani, H.J., "Doppelpuls- und Konturlinien-Speckle-Holographie mit rechnergestützter Interferogrammauswertung", in: "Holografisch-interferometrische Messtechnik", Broschüre zur Abschlusspräsentation des vom BMBF geförderten Verbundprojektes, VDI-Technologiezentrum, S. 64-87, Mai 1995.

16) Pedrini, G., Zou, Y.L., Tiziani, H.J., "Digital double-pulsed holografic interferometry for vibration analysis", Journal of Modern Optics, Vol. 42, No. 2, S. 367-374, 1995.

17) Schnars, U.; Osten, W.; Jüptner, W.; Sommer, K.," Advances of digital holography for experiment diagnostics in space". Proc. 46th International Astronautical Congress, Oslo, Norway, paper IAF-95-J.5.01 October 2-6, 1995.

18) Schönleber, M., Cedilnik, G., Tiziani, H.J., "Joint transform correlator subtracting a modified Fourier spectrum", Applied Optics, 10 Nov 1995, Vol. 34, No. 32, S. 7532-7537, 1995.

19) Schönleber, M., Tiziani, H.J., "Face recognition with a joint transform correlator", Proceeding des "6th Topical meeting of the European Optical Society (Optics and Information) in Mulhouse (F)", 23.10.-26.10.1995.

20) Tiziani, H.J., "Application of Computer Generated Holography", in: Application of Holography, Expert Verlag, 1995.

21) Tiziani, H.J., "High Precision Surface Topography Measurement", in: Optical 3-D Measurement Techniques III, Gruen Kahmen (eds.), Wichmann Verlag, Heidelberg, 1995.

22) Tiziani, H.J., "Storage materials, Photorefractive crystals", in: Application of Holography, Expert Verlag, 1995.

23) Tiziani, H.J., Franze, B., "Interferometrie an rauhen Oberflächen mit Laserdioden", Broschüre zur Abschlusspräsentation des vom BMBF geförderten Verbundprojekts "Weiterführende Ansätze in der Interferometrie", VDI Technologiezentrum Physikalische Technologien, Düsseldorf, Mai 1995.

24) Tiziani, H.J., Jordan, H.-J., Beiträge zu "Optical Non-Contact Techniques for Engineering Surface Metrology", European Commission, BCR-Information - Applied Metrology, Report EUR 16161 EN, 1995.

25) Tiziani, H.J., Pedrini, G.,"Double Pulse Speckle Interferometry for vibration analysis", in: Application of Holography, Expert Verlag, 1995.

26) Tiziani, H.J., Windecker, R., "Mikroskopische lasergestützte Messtechnik zur Mikro- und Makrostrukturanalyse", in: Laserforschung und Lasertechnik, Broschüre zur Ergebnispräsentation Laser ´95, VDI Technologiezentrum Physikalische Technologien, S. 41-52, 1995.

27) Windecker, R., Haible, P., Tiziani, H.J., "Fast coherence scanning interferometry for measuring smooth, rough and spherical surfaces", Journal of Modern Optics, Vol. 42, No. 10, S. 2059-2069, 1995.

28) Windecker, R., Tiziani, H.J., "Topometry of technical and biological objects by fringe projection", Applied Optics, Vol. 34, No. 19, S. 3644-3650, 1995.

29) Windecker, R., Tiziani, H.J., "Semispatial, robust, and accurate phase evaluation algorithm", Applied Optics, Vol. 34., No. 31, S. 7321-7326, 1995.

30) Windecker, R., Tiziani, H.J., Thiel, H.J., Jean, B., "Corneal topometry by fringe projection-limits and possibilities", Tagungsbeitrag zur BIOS Europe ´95, SPIE Vol. 2628, S. 218-230, 1995.

Publikationen 1994

1) Docchio, F., Perini, U., Tiziani, H.J., "A combined distance and surface profile measurement system for industrial applications: a European project", Meas. Sci. Technol. 5, S. 807-814, 1994.

2) Elandaloussi, F.; Holm, D.; Jüptner, W.; Osten, W.; Rudolf, K.; Wogatzki, E.; Richter, B.," Verification of the Applicability of the Relief Inspection Method for Machine-welded Seams". JOPAG / 11.94-PRG-255,.1994.

3) Han, S., Dalhoff, E., Fischer, E., Kreuz, S., Tiziani, H.J., "Double heterodyne interferometer using a multimode laser diode", SPIE, Vol. 2321, S. 773-776, 1994.

4) Hembd, Ch., Tiziani, H.J., "Diffractive optical elements for CO2 laser-beam diagnostics", Optics and Laser Technology, Vol. 26, No. 1, S. 9-14, 1994.

5) Holm, D.; Osten, W.; Mieth, U.; Jüptner, W.; Rudolf, K.," Identification and integrity verification of final disposal casks". Proc. SPIE Vol. 2248, 24-32 ,1994.

6) Ivanov, E.; Osten, W.; Jüptner, W.," An image processing system for monitoring of conveyor belt systems". Proc. SPIE Vol. 2183, 301-312 ,1994.

7) Joenathan, C., Franze, B., Tiziani, H.J., "Oblique Incidence and Observation Electronic Speckle Pattern Interferometry", Applied Optics, Vol. 33, No. 31, S. 7307-7311, 1994.

8) Jüptner, W.; Osten, W.," Digital image processing in holographic nondestructive testing". In: X:P:V: Maldague (Ed.): Advances in signal processing for nondestructive evaluation of materials. NATO ASI Series, Series E: Applied Sciences - Vol. 262, Kluwer Academic Publishers, Dordrecht, Boston, London, pp. 85-101 1994.

9) Jüptner, W.; Osten, W.," Industrial Optical Inspection". In: M. Pietikäinen and H. Hakalahti: Proc. Workshop on Machine Vision for Advanced Production, Oulu, pp. 11-17 ,June 1994.

10) Jüptner, W.; Kreis, T.; Mieth, U.; Osten, W.," Application of neural networks and knowledge based systems for automatic identification of fault indicating fringe patterns". Proc. SPIE Interferometry´94 Vol. 2342, 16-26 ,1994.

11) Leonhardt, K., Droste, U., Tiziani, H.J., "Microshape and rough surface analysis by fringe projection", Applied Optics, Vol. 33, No. 31, S. 7477-7488, Nov. 1994.

12) 45. Mieth, U.; Osten, W.; Jüptner, W.,"Knowledge assisted detection of material faults based on holographic interferograms". Proc. 13. IMEKO World Congress Torino Vol. 3, TC 15.2, pp.1855-1860 ,1994.

13) Nadeborn, W., Andrä, P., Osten, W.," Geometrische Modellierung und Parameteridentifikation bei Feldmessverfahren zur optischen Formerfassung". Proc. Laser´93, Springer Verlag, Berlin, pp. 227-230.,1994

14) Osten, W.," Berührungslose Oberflächenprüfung mittels optischer Techniken". Proc. ILA´94-Kongress für Digitale Bildverarbeitung, 30. Mai-01., Berlin, S. 79-87., Juni 1994.

15) Pedrini, G., Tiziani, H.J.,"Double Pulse-Electronic Speckle Interferometry for Vibration Analysis", Applied Optics, Vol. 33, No. 34, S. 7857-7863, 1994.

16) Pedrini, G., Tiziani, H.J.,"Double Pulse-Electronic Speckle Interferometry", VDI-Bericht Nr. 1118, 1994.

17) Tiziani, H.J., "High precision optical measurement methods", SPIE Proc. on European Symposium on optical measurements and Sensors for the process in industries, Vol. 2248, S. 2-15, Frankfurt, 1994.

18) Tiziani, H.J., "Oberflächenmesstechnik, makroskopisch/mikroskopisch", COMETT Seminar, "Optoelektronik für die Qualitätskontrolle", Technische Hochschule Darmstadt, Februar 1994.

19) Tiziani, H.J., Jordan, H.J., Leonhardt, K., "Confocal microscopy and projected fringes for surface characterization", Proceedings Workshop "Non contact surface metrology", Philips Eindhoven, 17.-18. März 1994.

20) Tiziani, H.J., Uhde, H.-M.,"Three dimensional image sensing with chromatic confocal microscopy", Applied Optics, Vol. 33, No. 10, S. 1838-1844, 1994.

21) Tiziani, H.J., Uhde, H.-M.,"Three-dimensional analysis by microlens-array confocal arrangement", Applied Optics, Vol. 33, No. 4, S. 567-572, 1994.

22) Yu, Q.; Andresen, K.; Osten, W.; Jüptner, W.," Analysis and removing of the systematic phase error in interferograms". Opt. Eng. 33 5, 1630-1637.1994.

23) Zou, Y., Pedrini, G., Tiziani, H.J., "Contouring by electronic speckle pattern interferometry employing divergent dual beam illumination", Journal of Modern Optics, Vol. 41, S. 1637-1652, 1994.

24) Zou, Y., Pedrini, G., Tiziani, H.J., "Derivatives obtained directly from displacement data", Optics Communications, Vol. 111, S. 427-432, 1994.

Publikationen 1993

1) Dalhoff, E., Fischer, E., Kreuz, S., Tiziani, H.J., "Double heterodyne interferometry for high precision distance measurements", in: Gruen, Kahmen (eds.), "Optical 3D-Measurement Techniques II", Wichmann, Karlsruhe, S. 379-384, 1993.

2) Dalhoff, E., Fischer, E., Kreuz, S., Tiziani, H.J., "Interferometry for High Resolution Absolute Distance Measuring by Larger Distances", in: Wilhelm Waidelich (ed.), "Laser in der Technik", Springer, Berlin, S. 248-251, 1993.

3) Diao, H., Zou, Y., Tiziani, H.J., "Design consideration of a dual-beam ESPI optical system for contouring", Optik, Vol. 93, No. 2, S. 45-51, 1993.

4) Fischer, E., Dalhoff, E., Ittner, T., Kreuz, S., Tiziani, H.J., "Two wavelength heterodyne absolute ranging technique using supressed carrier modulation", in: Optics as a key to High Technology: 16th Congress of the International Comission for Optics, Gy. Ako, T. Lippényi, G. Lupkovics, A. Podmaniczky, Editors, Proc SPIE, Vol. 1983, S. 692-693, 1993.

5) Haupt, Ch., Jäger, E., Rothe, A., Daffner, M., Tiziani, H.J., "Collimating laser diodes with hybrid optics", in: "Optics as a key to High Technology", Proceedings zur 16. ICO-Tagung, Budapest Hungary, S. 658-659, 1993.

6) Haupt, Ch., Pahlke, M., Jäger, E., Tiziani, H.J., "Holographisch-optische Elemente zur Strahlformung", Ergebnisbericht zur 1. Projektphase des SFB's 349 "Hochdynamische Strahlführungs- und Strahlformungseinrichtungen für die räumliche Bearbeitung mit Laserstrahlen", 19-37, Februar 1993.

7) Holm.D, W. Jüptner, U. Mieth, W. Osten, E. Leitner, K. Rudolf, E. Wogatzki, B. Richter," Identification and Integrity verification of final disposal casks by radiographical and optical techniques". JOPAG/11.92-PRG-235. 1993.

8) Ivanov, E.; Holm, D.; Osten, W.; Jüptner, W.," An image processing system for material flaw control in coal mining industry". Lecture Notes in Computer Science Vol. 719. Springer Verlag Berlin, pp. 716-720 1993.

9) Lei, F., Tiziani, H.J., "Atmospheric influence on image quality of airborne photographics", Optical Engineering, Vol. 32, No. 9, S. 2271-2280, 1993.

10) Leonhardt, K., Droste, U., Schön, S., Voland, Ch., Tiziani, H.J., "Microshape and rough surface analysis by fringe projektion", SPIE Proc. Optics as a key to High Technology, Vol. 1983, S. 311-312, 1993.

11) Mieth, U.; Osten, W.; Jüptner, W.," Knowledge assisted fault detection based on line features of skeletons". In: Jüptner, W.; Osten, W.(Eds.): Proc. Fringe'93. 2nd International Workshop on Automatic Processing of Fringe Patterns. Akademie Verlag Berlin, 367-373 1993.

12) Nadeborn, W.; Andrä, P.; Osten, W.," Model based identification of system parameters in optical shape measurement". In: Jüptner, W.; Osten, W.(Eds.): Proc. Fringe'93. 2nd International Workshop on Automatic Processing of Fringe Patterns. Akademie Verlag Berlin, 214-222 1993.

13) Nadeborn, W.; Andrä, P.; Jüptner, W.; Osten, W.," Evaluation of optical shape measurement methods with respect to accuracy of data". Proc. SPIE Vol. 1983, 928-930 1993.

14) Osten, W.; Nadeborn, W.; Andrä, P.," Model based compensation of distortions in 3D-shape measurement". Proc. SPIE Vol. 2003, 269-274 1993.

15) Osten, W.; Jüptner, W.; Mieth, U.," Knowledge assisted evaluation of fringe patterns for automatic fault detection". Proc. SPIE Vol. 2004, 256-268 1993.

16) Osten, W.; Jüptner, W.," Bildverarbeitung in der interferometrischen Form- und Verformungsmessung". In. H. Kohler (Ed.): Laser-Technologie und Anwendungen. 3. Ausgabe, Vulkan-Verlag, Essen, 58-68 1993

17) Pahlke, M., Haupt, Ch., Tiziani, H.J., "Diffraktive Elemente für die Materialbearbeitung", in: "Laser in der Technik, Proceeding zur Laser '93", W. Waidelich (Ed.), Springer Verlag, Berlin, Heidelberg, New York, S. 679-682, 1993.

18) Pedrini, G., Pfister, B., Tiziani, H.J., "Double pulse electronic speckle interferometry", Journal of Modern Optics, Vol. 40, No. 1, S. 89-96, 1993.

19) Pedrini, G., Tiziani, H.J., "Double pulse-electronic speckle interferometry (DP-ESPI)", in: Proceeding of the 11. International Congress LASER '93, Springer Verlag, 1993.

20) Peng, X., Zou, Y. L., Pedrini, G., Tiziani, H.J., "A simplified multi-wavelength ESPI contouring technique based on a diode laser system 2: Automatic fringe analysis", Optik, Vol. 92, No. 3, S. 114-118, 1993.

21) Schönleber, M., Tiziani, H.J., "A spatial light modulator used for the Fourier transform of video images", J. of Modern Optics, Vol. 40, No. 10, S. 2039-2052, 1993.

22) Seitz, G., Tiziani, H.J., "Resolution limits of active triangulation systems", Optical Engineering, Vol. 32, No. 6, S. 1374-1383, 1993.

23) Tiziani, H.J., "Holographisch-interferometrische Messmethoden: Stand der Technik - Entwicklungspotentiale", Daimler Benz Technologie - Workshop, "Holographie, Interferometrie", Lämmerbuckel, S. 1-17, 1993.

24) Tiziani, H.J., "Laser Speckle", in: Messtechniken mit Lasern, Bimberg, D. (Ed), Expert-Verlag, S. 131-159, 1993.

25) Tiziani, H.J., "Optical methods for surface measurements: state of the art", Proceedings Sensor '93, Bd. 3, Nürnberg, S. 113-122, 1993.

26) Tiziani, H.J., "Optical Techniques for Shape Measurements", Proc. of the 2nd International Workshop on Automatic Processing of Fringe Patterns, Fringe Bremen, Edit. W. Jüptner u. W. Osten, H`93 Akademie Verlag, Berlin, S. 165-174, 1993.

27) Tiziani, H.J., "Optische Interferometrie in der Messtechnik", in: Messtechniken mit Lasern, Bimberg, D. (Ed), Expert Verlag, S. 103-130, 1993.

28) Tiziani, H.J., Schmidt, J., Kasal, P., "Temperature analysis using phase conjugations", International Journal of Optical Computing, 1993.

29) Wieland, P., Tiziani, H.J.,"Rechnerisch synchronisierter 3D-Sensor", LASER '93, W. Waidelich (Hrsg.), Springer, München, 1993.

30) Zou, Y., Peng, X., Tiziani, H.J., "Two-wavelength DSPI surface contouring through the temperature modulation of a laser diode", Optik, Vol. 94, No. 4, S. 155-158, 1993