Klaus Körner studied electrical engineering, optics and instrumentation at the Technische Universität (TU) Ilmenau, Germany. From 1974 he was with the Center of Scientific Instrument Construction at the Academy of Science in Berlin. He worked in the fields of FT-IR-Spectroscopy, grazing-incidence interferometry especially for silicon wafer flatness testing, and interference microscopy for ultra precision machined surfaces. In 1986 he received his doctoral degree in engineering (Ph.D.) from the TU Ilmenau. From 1992 to 1998 he was with the Fraunhofer Institute IPK in Berlin. There, he worked with his group on the fields of interferometry, phase-shifting interference microscopy, fringe projection techniques, and optical inspection. In 1998 he joined the Institut für Technische Optik (ITO) at the Universität Stuttgart. He currently leads the 3-D surface metrology group. His main research interests are surface profile measurements including short coherence interferometry, and fringe projection techniques in the microscopic and macroscopic scale.